Abstract:For zoom and focus applications in the UV and IR spectral range mirrors with actively deformable surfaces are promising for reflective adaptive optics as an alternative to refractive optics. To realise an adjustable focus length interval from infinity to the centimetre range the needed surface deformation can be described by a hemisphere. For shorter focus lengths and optical on-axis applications the parabolic shape has to be used. The actuation principle of a quasistatic micromirror with actively deformable s… Show more
“…a result derived by Conrad et al 18 Such a case may arise if the thick mirror substrate were replaced by a thin wafer.…”
Section: Review Of Scientific Instrumentsmentioning
confidence: 85%
“…Here, following Conrad et al, 18 we substitute thermal strain with piezoelectric strain, which, by design, occurs in a direction perpendicular to the applied voltage, in the long direction of the mirror. This strain is proportional to the coefficient of the piezoelectric tensor, d 31 , and the applied electric field, Ez: d 31 Ez.…”
A new generation of adaptive x-ray optics (AXO) is being installed on high-coherent-flux x-ray beamlines worldwide to correct and control the optical wavefront with sub-nm precision. These ultra-smooth mirrors achieve high reflectivities at glancing angles of incidence and can be hundreds of mm long. One type of adaptive x-ray mirror relies on piezoelectric ceramic strips which are segmented into channels and actuated to induce local, longitudinal bending, generating one-dimensional shape changes in the mirror substrate. A recently described mirror model uses a three-layer geometry with parallel actuators on the front and back surfaces of a thicker mirror substrate. By analogy to a solved problem in the thermal actuation of a tri-metal strip, we show that the achievable bending radius varies approximately as the square of the substrate thickness. We provide an analytic solution and simulate bending using a finite-element model.
“…a result derived by Conrad et al 18 Such a case may arise if the thick mirror substrate were replaced by a thin wafer.…”
Section: Review Of Scientific Instrumentsmentioning
confidence: 85%
“…Here, following Conrad et al, 18 we substitute thermal strain with piezoelectric strain, which, by design, occurs in a direction perpendicular to the applied voltage, in the long direction of the mirror. This strain is proportional to the coefficient of the piezoelectric tensor, d 31 , and the applied electric field, Ez: d 31 Ez.…”
A new generation of adaptive x-ray optics (AXO) is being installed on high-coherent-flux x-ray beamlines worldwide to correct and control the optical wavefront with sub-nm precision. These ultra-smooth mirrors achieve high reflectivities at glancing angles of incidence and can be hundreds of mm long. One type of adaptive x-ray mirror relies on piezoelectric ceramic strips which are segmented into channels and actuated to induce local, longitudinal bending, generating one-dimensional shape changes in the mirror substrate. A recently described mirror model uses a three-layer geometry with parallel actuators on the front and back surfaces of a thicker mirror substrate. By analogy to a solved problem in the thermal actuation of a tri-metal strip, we show that the achievable bending radius varies approximately as the square of the substrate thickness. We provide an analytic solution and simulate bending using a finite-element model.
“…Other, in this work not presented models for the (00.4) diffraction peak height and for the full width at half maximum values of the (00.2) and (00. 4 (Fig. 14) regression coefficients normalized absolute value / % to film thickness normalized grain size interactions preferred AlN grain orientation.…”
Section: Integral Film Stressmentioning
confidence: 99%
“…The development of highly textured AlN thin films used as a piezoelectric active material in micro-opto-electromechanical systems (MOEMS), such as actively focusing micro mirrors [4] are of prior interest for this work. To achieve piezoelectric properties within polycrystalline AlN thin films the polar axis and therefore the textural alignment plays a dominant role.…”
Extensive studies on reactively magnetron sputtered aluminum nitride (AlN) thin films and the evaluation of the material properties influenced by the deposition parameters were performed utilizing statistical methods. The use of the inverse piezoelectric effect of poly-crystalline AlN thin films in actively deformable micro mirrors are of prior interest for this work. To achieve piezoelectric material properties but also to respect technological conditions in MOEMS manufacturing processes the textural quality, the grain size, the intrinsic material stress, the deposition rate and therefore the non-uniformity in layer thickness are investigated. Wide, randomized series of experiments on process pressure, nitrogen / argon gas flow ratio, plasma rf power and target to substrate separation of the AlN sputter deposition process on amorphous titanium aluminid thin films on silicon substrates were performed. Polynomial based models of the thin films properties influenced by th e deposition parameters are presented. The qualities of these models are evaluated by statistical methods. With the use of these models advantageous set points of the deposition process are presented. This set points enables highly textured polycrystalline AlN films, low or zero stressed films, big grain size and low non-uniformity in layer thicknesses
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