2009 Twenty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition 2009
DOI: 10.1109/apec.2009.4802956
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Active Fault Protection for High Power IGBTs

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Cited by 13 publications
(4 citation statements)
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“…Advanced gate drive circuits [13,14] that allow reduction of the dI/dt during turnoff under short circuit conditions have been developed using the principle of varying the gate resistance after detection of the fault. During a load short circuit, the IGBT collector current can rise to several times its steady state value.…”
Section: Discussionmentioning
confidence: 99%
“…Advanced gate drive circuits [13,14] that allow reduction of the dI/dt during turnoff under short circuit conditions have been developed using the principle of varying the gate resistance after detection of the fault. During a load short circuit, the IGBT collector current can rise to several times its steady state value.…”
Section: Discussionmentioning
confidence: 99%
“…Thus, short-circuit detection is typically implemented through the gate driver hardware circuits for rapid protection, rather than reply on online diagnostic algorithms. The most well-known SC diagnostic method is desaturation detection in which the on-state voltage of the switching device will be detected by a sensing diode and compared to a predetermined value [7][36] [37]. To avoid false diagnosis of the SC fault and trigger the protection, this solution requires a programmed delay, the so-called blanking time, of around 1-5…”
Section: B Diagnosis Of Sc Switching Faultmentioning
confidence: 99%
“…[7] proposed a novel switching control method for di/dt on and du/dt off. [8]- [9] both proposed a closed-loop control method based on parasitic inductance voltage to measure switching elements.…”
Section: Introductionmentioning
confidence: 99%