2019
DOI: 10.1088/2053-1591/aadcc8
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Activation of electrical defects under Rapid Thermal Annealing in Cz-silicon for solar cells application

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Cited by 3 publications
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“…This indicates that silicon sequentially doped with Ni and Zn impurities has a high degree of crystallinity, which depends on the intensity. The shift of the intensity of X-rays towards smaller scattering angles shows the microdistortion of the silicon crystal with an increase in the lattice constant d. If the position of the breakline is shifted without loss of intensity, then this indicates a uniform distortion of the crystal lattice [14].…”
Section: Description and Analysis Of Resultsmentioning
confidence: 99%
“…This indicates that silicon sequentially doped with Ni and Zn impurities has a high degree of crystallinity, which depends on the intensity. The shift of the intensity of X-rays towards smaller scattering angles shows the microdistortion of the silicon crystal with an increase in the lattice constant d. If the position of the breakline is shifted without loss of intensity, then this indicates a uniform distortion of the crystal lattice [14].…”
Section: Description and Analysis Of Resultsmentioning
confidence: 99%