Acquisition and classification of static single-event upset cross section for SRAM-based FPGAs

Zhibin, 姚志斌 Yao; Ruyu, 范如玉 Fan; Hongxia, 郭红霞 Guo; Zhongming, 王忠明 Wang; Baoping, 何宝平 He; Fengqi, 张凤祁 Zhang; Keying, 张科营 Zhang

doi:10.3788/hplpb20112303.0811

强激光与粒子束

2011

DOI: 10.3788/hplpb20112303.0811

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Acquisition and classification of static single-event upset cross section for SRAM-based FPGAs

姚志斌 Yao Zhibin¹,

范如玉 Fan Ruyu²,

郭红霞 Guo Hongxia³

et al.

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Acquisition and classification of static single-event upset cross section for SRAM-based FPGAs

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