Negative tone molecular resists using cationic polymerization: Comparison of epoxide and oxetane functional groups J.Simple fabrication of UV nanoimprint templates using critical energy electron beam lithography Five different molecular glass chemically amplified photoresists which utilized different solubility switching mechanisms and chemistries, based on a tris͑4-hydroxyphenyl͒ethane ͑THPE͒ core, were synthesized and their performance compared. Three different positive tone systems were designed based on acid catalyzed deprotection of a phenolic hydroxyl group protected with one of the following groups: tert-butoxycarbonyl ͑tBoc͒, tetrahydropyranyl, or ethoxyethyl. Two negative tone systems were designed; one using cationic epoxide polymerization of pendant epoxides and one using condensation of the unprotected THPE with a multifunctional cross-linking additive. The tBoc system and negative tone systems showed good performance under deep UV and large field e-beam patterning, but the epoxide system showed far superior performance for high resolution electron beam patterning. It was able to produce 50 nm 1:1 line/space patterns and 30 nm lines on 1:3 line/space patterns with high sensitivity, good contrast, and a very low line edge roughness ͑3͒ of 2.3 nm using 100 keV electron beam patterning.