2017
DOI: 10.7567/jjap.56.065502
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Achieving composition-controlled Cu2ZnSnS4 films by sulfur-free annealing process

Abstract: Cu2ZnSnS4 (CZTS) films were firstly prepared by the nonvacuum spin-coating method, and then annealed at 550 °C in N2 atmosphere. A graphite box was used to inhibit the volatilization of gaseous SnS and S2 to suppress the CZTS decomposition and generation of MoS2 during annealing. The sulfur supplementation carried out in a conventional annealing process was not applied in this work. It was found that Sn loss was overcome and the compositions of postannealed films were close to that of precursor solution. Thus,… Show more

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Cited by 3 publications
(2 citation statements)
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“…Figure 1 illustrates the XRD patterns of CZTS thin film fabricated using various TEA concentrations (2, 3, 4, and 5 mg/mL). As presented in Figure 1, diffraction peaks were detected at 2 θ =28.53° (112), 32.98° (200), 47.33° (220), 56.17° (312), and 76.44° (332), suggesting the formation of kesterite‐type CZTS (CZTS, PDF#26‐0575) 23–26 . The diffraction peaks at 2 θ =40.13° (110) were related to the Mo back contact 27 .…”
Section: Resultsmentioning
confidence: 96%
See 1 more Smart Citation
“…Figure 1 illustrates the XRD patterns of CZTS thin film fabricated using various TEA concentrations (2, 3, 4, and 5 mg/mL). As presented in Figure 1, diffraction peaks were detected at 2 θ =28.53° (112), 32.98° (200), 47.33° (220), 56.17° (312), and 76.44° (332), suggesting the formation of kesterite‐type CZTS (CZTS, PDF#26‐0575) 23–26 . The diffraction peaks at 2 θ =40.13° (110) were related to the Mo back contact 27 .…”
Section: Resultsmentioning
confidence: 96%
“…As presented in Figure 1, diffraction peaks were detected at 2θ =28.53 (112), 32.98 (200), 47.33 (220), 56.17 (312), and 76.44 (332), suggesting the formation of kesterite-type CZTS (CZTS, PDF#26-0575). [23][24][25][26] The diffraction peaks at 2θ =40.13 (110) were related to the Mo back contact. 27 For two samples prepared using TEA concentrations (2, and 3 mg/mL), the diffraction peaks located at 2θ =27.05 (100) planes, of the wurtzite CZTS) [28][29][30] The intensity of the peak corresponding to the CZTS phase increased as the TEA concentration increased.…”
Section: Resultsmentioning
confidence: 99%