2013
DOI: 10.1016/j.mcm.2012.11.014
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Accurate SPICE compatible CNT interconnect and CNTFET models for circuit design and simulation

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Cited by 12 publications
(5 citation statements)
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“…Among these procedures, DFT simulations provide proven results thanks to the fact that Schrodinger’s equation is solved numerically with exchange-correlation functionals which model the electron–electron and electron–ion interactions accurately. DFT is a widely-used method in ab initio simulations giving precise results for a broad range of nano devices such as CNTs [ 45 ], graphene [ 46 ] and molecular devices [ 47 ]. Various parameters such as electron density, DOS and total energy of nano structures can be obtained utilizing DFT.…”
Section: Methodsmentioning
confidence: 99%
“…Among these procedures, DFT simulations provide proven results thanks to the fact that Schrodinger’s equation is solved numerically with exchange-correlation functionals which model the electron–electron and electron–ion interactions accurately. DFT is a widely-used method in ab initio simulations giving precise results for a broad range of nano devices such as CNTs [ 45 ], graphene [ 46 ] and molecular devices [ 47 ]. Various parameters such as electron density, DOS and total energy of nano structures can be obtained utilizing DFT.…”
Section: Methodsmentioning
confidence: 99%
“…Various carbon nanotube FET (CNTFET) models have been reported in recent years [15][16][17][18][19][20][21][22]; however, some of them use simplifications, making it questionable when evaluating the transient response and device dynamic performance, while other models are described in terms of an integral function that requires intensive calculation efforts, making it difficult to implement in circuit simulators like SPICE. Recently, two very effective models for CNT have been developed at Stanford [5,6,9,10]: (i) a circuit-compatible SPICE model for CNTFET, (ii) a compact virtual source model for CNTFET.…”
Section: Formulation Of the Compact Cntfet Modelmentioning
confidence: 99%
“…The SNM is defined as the maximum amount of voltage noise that can be tolerated at the cross -inverter output nodes without flipping the cell [25]. It could be determined by the voltage transfer characteristics (VTCs) of the cross -coupled inverters.…”
Section: B Sram Cellsmentioning
confidence: 99%