2011
DOI: 10.1088/0957-0233/22/7/075301
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Accurate phase expansion on reference planes in grating projection profilometry

Abstract: A novel phase expansion technology based on a binary quadratic rational polynomial model is proposed. Firstly, the unwrapped phase distribution on reference planes parallel with a zero reference plane in a different grating project profilometry measurement system is analyzed and synthesized. Then a binary quadratic rational polynomial model is proposed to express the uneven phase distribution on every reference plane. The least-squares iterative estimation method based on a first-order Taylor series expansion … Show more

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Cited by 6 publications
(1 citation statement)
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References 15 publications
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“…To avoid phase errors in the checkerboard corners, we used only the phase from the white squares (having morphologically eroded boundaries to avoid black-to-white transition), and we interpolate the phase values using a 5th order 2D polynomial function to all pixels following a similar procedure as described in Ref. [24].…”
Section: B Stereo Vision Calibrationmentioning
confidence: 99%
“…To avoid phase errors in the checkerboard corners, we used only the phase from the white squares (having morphologically eroded boundaries to avoid black-to-white transition), and we interpolate the phase values using a 5th order 2D polynomial function to all pixels following a similar procedure as described in Ref. [24].…”
Section: B Stereo Vision Calibrationmentioning
confidence: 99%