Accurate method for determining adhesion of cantilever beams

Boer, Maarten P. de; Michalské, Terry A.

doi:10.1063/1.370809

Cited by 239 publications

(172 citation statements)

References 26 publications

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“…The elastocapillary length ec corresponds to the minimal length above which capillary forces can bring the sheets together and has been identified previously in studies of the failure of micro-mechanical structures upon drying (Mastrangelo & Hsu 1993;de Boer & Michalske 1999) or hair clumping (Bico et al 2004). The scale eg is an elastogravity length.…”

Section: Experimental Setup and Dimensionless Numbersmentioning

confidence: 97%

Dynamics of elastocapillary rise

2011

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We present the results of a combined experimental and theoretical investigation of the surface-tension-driven coalescence of flexible structures. Specifically, we consider the dynamics of the rise of a wetting liquid between flexible sheets that are clamped at their upper ends. As the elasticity of the sheets is progressively increased, we observe a systematic deviation from the classical diffusive-like behaviour: the time to reach equilibrium increases dramatically and the departure from classical rise occurs sooner, trends that we elucidate via scaling analyses. Three distinct temporal regimes are identified and subsequently explored by developing a theoretical model based on lubrication theory and the linear theory of plates. The resulting free-boundary problem is solved numerically and good agreement is obtained with experiments.

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Section: Experimental Setup and Dimensionless Numbersmentioning

confidence: 97%

Dynamics of elastocapillary rise

2011

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“…When a CNT is in a s-shape configuration [28], it forms a line-contact with the underlying surface as shown in Fig. 1 and thus interfacial adhesion is greatest during this stage of peeling.…”

Section: Nanotube Configurations During Peeling: Point-and Line-contactmentioning

confidence: 99%

“…1 and thus interfacial adhesion is greatest during this stage of peeling. In the arc-shape configuration [28], the CNT only forms a point-contact and thus interfacial adhesion is small. Because the external applied force acts through a known distance, the area under the force-displacement curve indicates the amount of work in opening the peeling point or crack tip.…”

Section: Nanotube Configurations During Peeling: Point-and Line-contactmentioning

confidence: 99%

Interfacial energy between carbon nanotubes and polymers measured from nanoscale peel tests in the atomic force microscope

Strus

Cano

Pipes

et al. 2009

Composites Science and Technology

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This document has been made available through Purdue e-Pubs, a service of the Purdue University Libraries. Please contact epubs@purdue.edu for additional information.Strus, Mark C.; Cano, Camilo I.; Pipes, R. Byron; Nguyen, Cattien V.; and Raman, Arvind, "Interfacial energy between carbon nanotubes and polymers measured from nanoscale peel tests in the atomic force microscope" (2009 b s t r a c tThe future development of polymer composite materials with nanotubes or nanoscale fibers requires the ability to understand and improve the interfacial bonding at the nanotube-polymer matrix interface. In recent work [Strus MC, Zalamea L, Raman A, Pipes RB, Nguyen CV, Stach EA. Peeling force spectroscopy: exposing the adhesive nanomechanics of one-dimensional nanostructures. Nano Lett 2008;8(2):544-50], it has been shown that a new mode in the Atomic Force Microscope (AFM), peeling force spectroscopy, can be used to understand the adhesive mechanics of carbon nanotubes peeled from a surface. In the present work, we demonstrate how AFM peeling force spectroscopy can be used to distinguish between elastic and interfacial components during a nanoscale peel test, thus enabling the direct measurement of interfacial energy between an individual nanotube or nanofiber and a given material surface. The proposed method provides a convenient experimental framework to quickly screen different combinations of polymers and functionalized nanotubes for optimal interfacial strength.Published by Elsevier Ltd.

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“…We discuss the possible equilibrium configurations of the beam actuator. Of these, two stable configurations exist beyond pull-in, denoted as pinned (arc-type) and flat (S-type) configurations [20,21]. The beam with free end not touching the dielectric surface is called floating.…”

Section: Introductionmentioning

confidence: 99%

Cantilever beam electrostatic MEMS actuators beyond pull-in

Gorthi

Mohanty

Chatterjee

2006

J. Micromech. Microeng.

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The operational range of electrostatic MEMS parallel plate actuators can be extended beyond pull-in in the presence of an intermediate dielectric layer, which has a significant effect on the behavior of such actuators. Here, we study the behavior of cantilever beam electrostatic actuators beyond pull-in using a beam model along with a dielectric layer. The results from the simple beam model are validated with 3D simulations performed in CoventorWare TM . Three possible static configurations of the beam are identified over the operational voltage range. We call them floating, pinned and flat; the latter two are also called arc-type and S-type in the literature. We compute the voltage ranges over which the three configurations can exist and the points where transitions occur between these configurations. Voltage ranges are identified where bi-stable and tri-stable states exist. A classification of all possible transitions (pull-in and pull-out as well as transitions we term pull-down and pull-up) is presented based on the dielectric layer parameters. Dynamic stability analyses are presented for the floating and pinned configurations. For high dielectric layer thickness, discontinuous transitions between configurations disappear and the actuator has smooth predictable behavior, but at the expense of lower overall tunability.

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Accurate method for determining adhesion of cantilever beams

Cited by 239 publications

References 26 publications

Dynamics of elastocapillary rise

Dynamics of elastocapillary rise

Interfacial energy between carbon nanotubes and polymers measured from nanoscale peel tests in the atomic force microscope

Cantilever beam electrostatic MEMS actuators beyond pull-in

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