Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters

Abstract

The fluorescence yield of the K-and L3-shell of gallium was determined using the radiometrically calibrated (reference-free) X-ray fluorescence instrumentation at the BESSY II synchrotron radiation facility. Simultaneous transmission and fluorescence signals from GaSe foils were obtained, resulting in K-and L3-shell fluorescence yield values (ω Ga,K = 0.515 ± 0.019, ω Ga,L3 = 0.013 ± 0.001) consistent with existing database values. For the first time, these standard combined uncertainties are obtained from a properly constructed Uncertainty Budget. These K-shell fluorescence yield values support Bambynek's semi-empirical compilation from 1972: these and other measurements yield a combined recommended value of ω Ga,K = 0.514 ± 0.010. Using the measured fluorescence yields together with production yields from reference Ga-implanted samples where the quantity of implanted Ga was determined at 1.3% traceable accuracy by Rutherford backscattering spectrometry, the K-shell and L3-subshell photoionization cross sections at selected incident photon energies were also determined and compared critically with the standard databases.

Quantifying nitrogen in GeSbTe:N alloys

“…The Fundamental Parameters (FP) method used to reduce the on-site XRF data does not yet usually have direct metrological traceability, although reference-free (off-site) measurements are now increasingly feasible, 9 and signicant progress is being made in establishing robust uncertainty budgets for this sort of metrology. 10 Therefore, independent Ion Beam Analysis (IBA) methods have been used to certify nitrogen standards for these GST lms. IBA is a toolbox of off-site complementary methods including elastic backscattering (EBS: Rutherford backscattering, RBS, is a special case of EBS), nuclear reaction analysis (NRA) and particle-induced X-ray emission (PIXE, another IBA technique entirely comparable to XRF except for the atomic excitation mechanism): IBA is commensurate with, but independent of, XRF; in particular, IBA is naturally a depth proling technique 11 whereas XRF has little or no direct depth sensitivity except in grazing incidence (GIXRF), especially with X-ray reectometry (XRR) methods.…”

Experimental determination of line energies, line widths and relative transition probabilities of the Gadolinium L x-ray emission spectrum

“…The Physikalisch-Technische Bundesanstalt (PTB), Germany's national metrology institute, determines atomic fundamental parameters by means of the reference-free XRF approach [2][3][4][5] . In X-ray spectrometry the term fundamental parameters (FP) generally refers to element specific parameters relevant to the production of XRF radiation such as fluorescence yields, line widths and energies, relative transition probabilities and, in the case of L-shells and higher shells, Coster-Kronig transition probabilities.…”

Quantitative manganese dissolution investigation in lithium-ion batteries by means of X-ray spectrometry techniques

“…For the fundamental parameters (m, Q Xi , s i ) either tabulated data are used or dedicated experiments are performed to determine the values in a physically traceable manner. 24,25 For the quantication of the manganese mass deposition, the uorescence yield as well as photoionization cross sections were taken from the xraylib database. 26 2.3 Near-edge X-ray absorption spectrometry NEXAFS is a contactless and non-destructive technique and allows for element sensitive investigations of the unoccupied valence structure of atoms in the sample.…”