2021
DOI: 10.3390/app112311237
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Accounting for Interelement Interferences in Atomic Emission Spectroscopy: A Nonlinear Theory

Abstract: The article describes a nonlinear theory of how the presence of third elements affects the results of analyzing the elemental composition of substances by means of atomic emission spectroscopy. The theory is based on the assumption that there is an arbitrary relationship between the intensity of the analytical line of the analyte and the concentration of impurities and alloying elements. The theory has been tested on a simulation problem using commercially available equipment (the SPAS-05 spark spectrometer). … Show more

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Cited by 6 publications
(5 citation statements)
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“…For different metal materials, a band that can reflect the properties of the material should be selected for radiation detection. The energy level distribution of different elements is different, and the line spectrum contains the characteristic information of various atoms in the material, and the corresponding wavelength and light intensity distribution also reflect the properties of the material [27,28]. For a given material, there may be multiple lines of the spectrum.…”
Section: Coaxial Optical Path Structurementioning
confidence: 99%
“…For different metal materials, a band that can reflect the properties of the material should be selected for radiation detection. The energy level distribution of different elements is different, and the line spectrum contains the characteristic information of various atoms in the material, and the corresponding wavelength and light intensity distribution also reflect the properties of the material [27,28]. For a given material, there may be multiple lines of the spectrum.…”
Section: Coaxial Optical Path Structurementioning
confidence: 99%
“…Chemometric approaches for interference correction are useful because they only require data treatment rather than additional hardware. Popova et al 108 presented a non-linear theory to account for the effect of interfering elements on analytical determinations using OES. The authors start from the proposition that most correction methods are linear in nature, which in fact is often not the case.…”
Section: Instrumentation Fundamentals and Chemometricsmentioning
confidence: 99%
“…For X-ray diffraction analysis of sediment samples, X-ray diffractometer XRD-7000 Shimadzu (CuKα radiation, 2.7 kW) was used according to the polycrystal method, X-ray exposure was performed at room temperature with long accumulation times (2 s) and a sampling interval 0.02° [36,37].…”
mentioning
confidence: 99%