2017
DOI: 10.1088/1742-6596/862/1/012017
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Accessible length scale of the in-plane structure in polarized neutron off-specular and grazing-incidence small-angle scattering measurements

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Cited by 7 publications
(4 citation statements)
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“…The combination of the 9.6 Â 10 9 n cm À2 s À1 white-beam flux on the sample and the uniform lateral response of the new detector system makes D17 particularly suited to off-specular studies. The number of experiments explicitly using these capabilities is therefore increasing (Adlmann et al, 2016;Pambou et al, 2016;Maruyama et al, 2016Maruyama et al, , 2017.…”
Section: Discussionmentioning
confidence: 99%
“…The combination of the 9.6 Â 10 9 n cm À2 s À1 white-beam flux on the sample and the uniform lateral response of the new detector system makes D17 particularly suited to off-specular studies. The number of experiments explicitly using these capabilities is therefore increasing (Adlmann et al, 2016;Pambou et al, 2016;Maruyama et al, 2016Maruyama et al, , 2017.…”
Section: Discussionmentioning
confidence: 99%
“…It was, however, not possible to determine the value of ξ mx precisely because the simulated profiles did not vary with the decreasing value of ξ mx . The length of the coupled area was too small compared with the length scale of the OSS measurement [43]. Figure 2.…”
Section: Polarized Oss Measurementmentioning
confidence: 97%
“…These values considerably differed from those determined by the OSS. This can be attributed to the difference in the accessible length scale between the OSS and GISANS [43]. In addition, ξ my was determined without ambiguity because the intensity profile in q y did not depend on the Fresnel coefficients [22].…”
Section: Polarized Gisans Measurementmentioning
confidence: 99%
“…OSS from lateral structures provides magnetization vectors, distances and in-plane correlations between domains or structural elements. While OSS can typically resolve structures between 500 and 100 µm, smaller structures can be investigated using grazing incidence neutron diffraction (GIND) [30]. The lateral and transverse resolution of PNR and OSS depends on the instrumental configuration, namely, the angular and wavelength resolution applied in the experiment.…”
Section: Introductionmentioning
confidence: 99%