Accessibility analysis for automatic inspection in CMMs by using bounding volume hierarchies

Álvarez, Braulio José Álvarez; Fernández, Pedro; Rico, J.C.; Mateos, S.; Suárez, Cecilia

doi:10.1080/00207540701241867

Cited by 12 publications

(7 citation statements)

References 30 publications

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“…The optical sensor visibility problem is a generalisation of the problem of global probe accessibility since the directions of probe accessibility correspond to the visibility points of a laser sensor [38,39,40]. In the literature, several works have used different methods to study accessibility, such as ray-tracing [41], the intersection of spherical crowns [42], local and global projection techniques [33,34] and [43], visibility maps [35], accessibility cone [44], the mathematical method [45] or transformation of part surfaces into facets (STL) and consideration of inspection points as a set [46].…”

Section: Probe Orientation Analysesmentioning

confidence: 99%

Touch Probe Measurement in Dimensional Metrology: A Review

Sadaoui¹,

Phan²

2021

IJAME

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Coordinate measuring machines (CMMs) are the standard displacement systems used for measurements in dimensional metrology. Since measurement with a touch probe mounted on a CMM provides high accuracy, repeatability, and reliability, it has been widely used for mechanical part inspection in manufacturing. The inspection process requires the use of several sensor orientations and optimal positioning of the part in order to measure all features. Recently, the field of probing path planning has become a huge and active research field. In this paper, various techniques aimed at generating the probe paths for part inspection are reviewed. Multiple issues related to the positioning of the part to maximise accessibility, analysis of probe accessibility to measure all inspection features, optimisation of the measurement sequence, distribution of measurement points, and collision avoidance are mentioned. The common research approaches and potential algorithms in this field are also discussed in this paper.

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Section: Probe Orientation Analysesmentioning

confidence: 99%

Touch Probe Measurement in Dimensional Metrology: A Review

Sadaoui¹,

Phan²

2021

IJAME

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“…The analysis of PMPs setup and probe configuration for CP3M is mainly integrated into accessibility analysis (Limaiem and Maraghy, 1997; Ziemian and Medeiros, 1997, 1998; Jackman and Park, 1998; Chiang and Chen, 1999; Spitz et al ., 1999; Rico et al ., 2002; Wu et al ., 2004; Alvarez et al ., 2008). If viewed disintegrated, the basic difference is in that the analysis of setup is PMP-oriented, whereas the accessibility analysis is PMP-feature-oriented.…”

Section: Analysis Of Pmps Setup For Cp3mmentioning

confidence: 99%

Toward a cyber-physical manufacturing metrology model for industry 4.0

Stojadinović

Majstorovic

Durakbasa

2020

AIEDAM

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Industry 4.0 represents high-level methodologies for the development of new generation manufacturing metrology systems, which are more intelligent (smart), autonomous, flexible, high-productive, and self-adaptable. One of the systems capable of responding to these challenges is a cyber-physical manufacturing metrology system (CP2MS) with techniques of artificial intelligence (AI). In general, CP2MS systems generate Big data, horizontally by integration [coordinate measuring machines (CMMs)] and vertically by control. This paper presents a cyber-physical manufacturing metrology model (CP3M) for Industry 4.0 developed by applying AI techniques such as engineering ontology (EO), ant-colony optimization (ACO), and genetic algorithms (GAs). Particularly, the CP3M presents an intelligent approach of probe configuration and setup planning for inspection of prismatic measurement parts (PMPs) on a CMM. A set of possible PMP setups and probe configurations is reduced to optimal number using developed GA-based methodology. The major novelty is the development of a new CP3M capable of responding to the requirements of an Industry 4.0 concept such as intelligent, autonomous, and productive measuring systems. As such, they respond to one smart metrology requirement within the framework of Industry 4.0, referring to the optimal number of PMPs setups and for each setup defines the configurations of probes. The main contribution of the model is productivity increase of the measuring process through the reduction of the total measurement time, as well as the elimination of errors due to the human factor through intelligent planning of probe configuration and part setup. The experiment was successfully performed using a PMP specially designed and manufactured for the purpose.

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“…Since ε is a very small value compared with the dimension of S 1 r , the neighborhood of s i,n in the k − n plane could be approximated as an arc with its radius R i,n being the radius of curvature of s i,n in the k-direction, as shown in Fig. 12(c), and s i+1,n = s i,n + 2 2R i,n ε − ε 2 k. (11) For the step over point s i+1,n calculated per (11), there is a corresponding pivot point c i+1,n 1 on C 1 , which ensures that the length of the line segment |s i+1,n c i+1,n 1 | is equal to the stylus length L. Based on this relationship, c i+1,n 1 on C 1 can be calculated…”

Section: Nominal Inspection Path Generationmentioning

confidence: 99%

“…12(b). 1 , e i+1 1 e i+1 2 } can be calculated from (11) to (14). This expansion process iterates, until the surface patch S 1 r is fully sampled with the generated nominal sweeping curves.…”

Section: Nominal Inspection Path Generationmentioning

confidence: 99%

“…With the sampled points already specified, another crucial subject is the accessibility analysis [8]- [11], which determines whether the probe tip of the CMM could touch the sample points without any interference between the probe and the CAD model and the follow-up global collision avoidance [12]- [15] when the interference is detected. The solution to the accessibility problem provides feasible stylus orientations for the probe tip to touch the prescribed sampled points.…”

Section: Introductionmentioning

confidence: 99%

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Automatic Generation of Five-Axis Continuous Inspection Paths for Free-Form Surfaces

Zhang

Tang

2017

IEEE Trans. Automat. Sci. Eng.

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Continuous five-axis sweep scanning is an emerging technology for free-form surface inspection, which, unlike the traditional three-axis inspection that works in a pointby-point manner, keeps the stylus tip in constant contact with the surface during the scanning, and thus could tremendously improve the inspection efficiency. However, at present, it mostly depends on humans to plan a five-axis inspection path, which severely affects the potential use of this new technology. In this paper, we report a practical algorithm, which is able to automatically generate a five-axis inspection path for an arbitrary free-form surface. The crux of this algorithm is that the unique kinematic characteristics of the five-axis inspection machine are fully considered and utilized when a path is planned. As a direct result of this consideration and utilization, the inspection efficiency is tremendously increased, often 20-30 times better than an inspection path obtained by any traditional path planning algorithm that disregards the inspection machine itself. The experiments performed by us have fully validated this point.Note to Practitioners-This paper was motivated by the current deficiency in the automatic generation of five-axis continuous inspection paths for free-form surfaces. Existing automatic inspection path planning algorithms are mainly designed for the traditional three-axis and three + two-axis point-by-point inspection process, which is time-consuming and unable to be utilized for the much more efficient five-axis continuous inspection because of the drastically different working patterns between them. We present a novel five-axis inspection path generation algorithm that strives to take full advantages of the unique characteristics and the working capacities of the fiveaxis inspection machine, where an inspection path is defined by a trajectory curve of the probe head and the corresponding sweep curve of the stylus tip. Starting with a near-optimum partitioning of the surface, we carefully design oscillating patterns for the sweep curve, while at the same time, try to shorten and smooth the trajectory curve as much as possible, with the given inspection sample accuracy always upheld. A five-axis inspection path thus generated will, in general, match the kinematical loads on the stylus and the probe head with their respective kinematic capacities (i.e., the limit on the speed and the acceleration of an axis). As a direct result of this design, the five-axis inspection machine is able to work under the maximum or near-maximum working capacity of every axis, thus tremendously shortening the total inspection time, often 20-30 times as compared with a path generated by a traditional method, such as the isoplanar method. Our algorithm is particularly suitable for the five-axis continuous inspection of large free-form parts, such as those in automobile and aerospace industry. Currently, our method is a suboptimal solution, since the surface partitioning is required to start from the boundary of the surface. In the future, ...

show abstract

Accessibility analysis for automatic inspection in CMMs by using bounding volume hierarchies

Cited by 12 publications

References 30 publications

Touch Probe Measurement in Dimensional Metrology: A Review

Touch Probe Measurement in Dimensional Metrology: A Review

Toward a cyber-physical manufacturing metrology model for industry 4.0

Automatic Generation of Five-Axis Continuous Inspection Paths for Free-Form Surfaces

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