2017 International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS) 2017
DOI: 10.1109/samos.2017.8344643
|View full text |Cite
|
Sign up to set email alerts
|

Access-aware DRAM failure-rate estimation under relaxed refresh operations

Abstract: We develop a methodology based on a series of tools that extract the elapsed time between consecutive memory

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(2 citation statements)
references
References 40 publications
0
2
0
Order By: Relevance
“…Dynamic Random Access Memory (DRAM) has been used as the main memory system due to offering relatively high-density storage and low cost [113,114]. A DRAM device is accessed by the CPU through a memory controller and is organized hierarchically into modules, ranks, chips, banks, and cells [37].…”
Section: Drammentioning
confidence: 99%
See 1 more Smart Citation
“…Dynamic Random Access Memory (DRAM) has been used as the main memory system due to offering relatively high-density storage and low cost [113,114]. A DRAM device is accessed by the CPU through a memory controller and is organized hierarchically into modules, ranks, chips, banks, and cells [37].…”
Section: Drammentioning
confidence: 99%
“…The error manifestation is specific by approximation and is obtained through the characterization of the memory devices. A characterization performs several iterations exposing real or simulated hardware conditions of possible error fluctuations by adjusting parameters and verifying how the reliability of the stored data is affected [12,13,65,106,114,120]. Table 2.1 exhibits some of the major characteristics of techniques for memory approximation, where techniques that adjust parameters are nondeterministic and depend on the value of the changed parameter.…”
Section: Types Of Errorsmentioning
confidence: 99%