Accelerated Nano-Optical Imaging through Sparse Sampling
Matthew Fu,
Suheng Xu,
Shuai Zhang
et al.
Abstract:The integration time and signal-to-noise ratio are inextricably linked when performing scanning probe microscopy based on raster scanning. This often yields a large lower bound on the measurement time, for example, in nano-optical imaging experiments performed using a scanning near-field optical microscope (SNOM). Here, we utilize sparse scanning augmented with Gaussian process regression to bypass the time constraint. We apply this approach to image charge-transfer polaritons in graphene residing on ruthenium… Show more
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