Accelerated life tests of CRT oxide cathodes

Gaertner, Georg; Raasch, D.; Barratt, David S.; Jenkins, S. N.

doi:10.1016/s0169-4332(03)00282-4

Cited by 21 publications

(10 citation statements)

References 7 publications

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“…Changes in cut-off performance over cathode lifetime can be attributed to a number of factors. There is good evidence for example of shrinkage (sintering) of the cathode spray layer over operating life [15] and the introduction of cermet technology may alter the sintering characteristics of the spray layer.…”

Section: Tube Performancementioning

confidence: 99%

12.3: Oxide Plus ‐ A Newly Developed Cathode for CRT Applications

Barratt

Filkin

Bakker

2003

Symp Digest of Tech Papers

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Section: Tube Performancementioning

confidence: 99%

12.3: Oxide Plus ‐ A Newly Developed Cathode for CRT Applications

Barratt

Filkin

Bakker

2003

Symp Digest of Tech Papers

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“…From a practical standpoint, this means that the failure mechanism remains the same for all the applied stress levels, i.e., the product units submitted to test will fail in the same manner across different stress levels. This assumption has been widely adopted in the ALT literature, for example, in the assessment of service life of solar thermal components (Carlsson, 2004), and the life prediction at use conditions of cathode ray tubes (Gaertner, 2003). Some authors however suggest checking the validity of the stressindependent assumption by means, for example, a graphical procedure where the slopes of the lines of the probability plots for the different stress levels should be roughly parallel (Whitman, 2003).…”

Section: Introductionmentioning

confidence: 99%

Time to failure assessment of products at service conditions from accelerated lifetime tests with stress-dependent spread in life

Droguett

Mosleh

2007

Pesqui. Oper.

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In accelerated lifetime testing (ALT) the assumption of stress-independent spread in life is commonly used and accepted because the resulting models are typically easier to use and data or past experience suggest that such a constrain is sometimes valid. However in many situations and with a variety of products the spread in life does depend on stress, i.e., the failure mechanism is not the same for all stress levels. In this paper the assessment of product time to failure at service conditions from ALT with stress-dependent spread is addressed by formulating a Bayesian framework where the time to failure follows a Weibull distribution, scale parameter dependency on stress is given by the Power Law, and two cases for the dependency between shape parameter and stress are discussed: linear relationship and, in order to allow a comparative analysis, stress-independent shape parameter. A previously published dataset is used to illustrate the procedure.Keywords: accelerated lifetime testing; Weibull distribution; Bayes' theorem; reliability. ResumoEm testes acelerados de vida (ALT) a suposição de que a dispersão do tempo de falha é independente do stress é freqüentemente empregada e aceita pois os modelos resultantes são tipicamente mais fáceis de utilizar e dados ou experiência adquirida sugerem que tal simplificação é algumas vezes válida. Entretanto, em muitas situações e para uma variedade de produtos, a dispersão do tempo de falha depende do stress, i.e., o mecanismo de falha não é o mesmo em todos os níveis de stress. Neste artigo, a estimação do tempo de falha do produto nas condições de serviço a partir de ALT com dispersão dependente do stress é discutida através da formulação de um modelo Bayesiano onde o tempo de falha segue uma distribuição de Weibull e o parâmetro de forma é dependente do stress via uma relação linear. Um conjunto de dados anteriormente publicado é utilizado para ilustrar o procedimento.Palavras-chave: testes acelerados de vida; distribuição de Weibull; teorema de Bayes; confiabilidade.Droguett & Mosleh -Time to failure assessment of products at service conditions from accelerated lifetime tests with stress-dependent spread in life 210

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“…The oxygen poisoning mechanisms that are associated with the reduction of electron emission in oxide cathodes have long been studied [14][15][16][17][18][19][20][21]. Indeed, the poisoning in early life significantly affects the entire life performance of oxide cathodes [21]. For this reason, the sealed-off tubes should be always be maintained at a high vacuum of 10 -7 ~ 10 -8 Torr, which could reach an ultra high vacuum of ~ 10 -10 Torr after long periods of operation by the getter action in the vacuum tube [13,20].…”

Section: Introductionmentioning

confidence: 99%

Oxide cathodes for reliable electron sources

Weon¹,

Je²,

Park³

et al. 2005

Journal of Information Display

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In this paper, we investigate the oxide cathodes for the development of reliable electron sources. Poisoning in oxide cathodes is one of the serious problems in achieving reliable electron emission. In particular, early poisoning induces poor life performance as will be demonstrated herein. The survivability of electron emission sources is significantly improved by high doping of high-speed activator. The robust oxide cathodes with 0.17 % Mg operating at about 1,050 K are expected to work for very long times (>100,000 hours). We suggest that this key idea will contribute to solving the basic problems in oxide cathodes such as poisoning or ion bombardment for high power or high frequency applications of electron sources.

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Accelerated life tests of CRT oxide cathodes

Cited by 21 publications

References 7 publications

12.3: Oxide Plus ‐ A Newly Developed Cathode for CRT Applications

12.3: Oxide Plus ‐ A Newly Developed Cathode for CRT Applications

Time to failure assessment of products at service conditions from accelerated lifetime tests with stress-dependent spread in life

Oxide cathodes for reliable electron sources

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