2014
DOI: 10.2478/jee-2014-0027
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Ac Impedance Spectroscopy Of Al/A-Sic/C–Si(P)/Al Heterostructure under Illumination

Abstract: The amorphous silicon carbide/crystalline silicon heterojunction was prepared and analyzed. The current-voltage (I − V ) measurements showed the barrier properties of prepared sample. Biased impedance spectra of Al/a-SiC/c-Si(p)/Al heterojunction under the standard illumination are reported and analyzed. AC measurements in the illuminated conditions were processed in order to identify electronic behavior using equivalent AC circuit which was suggested and obtained by fitting the measured impedance data. A phen… Show more

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Cited by 7 publications
(1 citation statement)
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“…To further understand the influence of SS in the photocurrent response, AC impedance spectroscopy characterization without illumination was performed to detect the frequency response of the c-Si(p)/a-SiC:H(p) heterojunction and identify its equivalent circuit. Nyquist plot fits (see supporting information), were performed with a parallel connection in addition to the series connection settled between the SCR and double layer capacitances [46]. This parallel capacitance represents SS capacitance which in principle appears in parallel with that of the SCR.…”
Section: Electrochemical Impedance Spectroscopymentioning
confidence: 99%
“…To further understand the influence of SS in the photocurrent response, AC impedance spectroscopy characterization without illumination was performed to detect the frequency response of the c-Si(p)/a-SiC:H(p) heterojunction and identify its equivalent circuit. Nyquist plot fits (see supporting information), were performed with a parallel connection in addition to the series connection settled between the SCR and double layer capacitances [46]. This parallel capacitance represents SS capacitance which in principle appears in parallel with that of the SCR.…”
Section: Electrochemical Impedance Spectroscopymentioning
confidence: 99%