AC and DC conductivity correlation: The coefficient of Barton–Nakajima–Namikawa relation

Tsonos, Christos; Kanapitsas, A.; Kechriniotis, Aristides I.; Petropoulos, Nicholas

doi:10.1016/j.jnoncrysol.2012.04.029

Cited by 19 publications

(11 citation statements)

References 42 publications

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“…It should be noted that the same mechanism presents a Cole-Davidson behavior at different temperatures. 38 Davidson behavior at different temperatures, 38 the results of the present study cannot assure that it is a universal behavior of this slow polarization process in polymeric materials based on the findings of the present study.…”

Section: Resultscontrasting

confidence: 76%

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Comments on frequency dependent AC conductivity in polymeric materials at low frequency regime

Tsonos

2019

Current Applied Physics

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The AC conductivity response in a broad frequency range of disordered materials is of great interest not only for technological applications, but also from a theoretical point of view. The Jonscher's power exponent value, and its temperature dependence, is a very important parameter in dielectric data analysis as well as the physical interpretation of conduction mechanisms in disordered materials. In some cases the power exponent of AC conductivity has been reported to be greater than 1 at the low frequency regime. This fact seems to contradict the universal dynamic response. The present work focuses on the analysis of dielectric spectroscopy measurements in polymeric materials, below ~100 MHz. The apparent power exponent n gets values in the range 0

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Section: Resultscontrasting

confidence: 76%

“…The dielectric loss mechanism is related to a polarization mechanism due to short range ions' motion and obeys the (BNN) relation. 38 At…”

Section: Resultsmentioning

confidence: 99%

Comments on frequency dependent AC conductivity in polymeric materials at low frequency regime

Tsonos

2019

Current Applied Physics

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“…In particular, equation (6.1) implies that both processes, for dc conductivity and dielectric relaxation, have the same activation energy [36]. The Barton-Nakajima-Namikawa relation has been found for a wide variety of di ferent materials: amorphous solids, ionic glasses, single crystals, polymers, micro-porous systems and proteins in hydrated state [182]. Although the above mentioned quantitative (empiric) relation exists between dc and ac properties of such (mostly) disordered materials, there is still no microscopic uni ed theory.…”

Section: Comparing the Presented Approach With Other Methods Of Analysismentioning

confidence: 99%

“…Indeed, there are empirical quantitative relations between resistive and capacitive properties in systems with transport through localised states [36] that are obtained for a wide variety of very di ferent materials [182]. This is generally acceptedly seen as an indication for a joint basis for both contributions [118].…”

Section: The Benefit Of Combining Resistive and Capacitive Modelsmentioning

confidence: 98%

“…The statement by Jonscher [78, p. 41], that no charges may migrate through the dielectric as a result of those processes, is tendentiously vague since the conduction process and the dielectric process in a single material can originate from the same underlying mechanism [37]. For example, the Barton-Nakajima-Namikawa relation, con rmed for many materials, implies the same underlying process for static conduction and dielectric properties (confer references [36,182] and see subsection 6.2.4).…”

Section: The Total Current Density and Its Contributionsmentioning

confidence: 99%

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A novel approach of immittance-spectra analysis and how it resolves a decade-old deviation of the Frenkel-Poole model

Amani¹

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As already indicated above, this work focuses primarily on the development of a novel method to analyse experimentally obtained immittance spectra by using process-speci c physical models dependent on external parameters. Ultimately, this allows the extraction of process-speci c parameters which are inherently linked to a physical meaning (e. g. an acceptor concentration or a barrier height, instead of a resistance or a capacitance) and can, hence, be better compared between experiments. Furthermore, the introduction of models with dependence on external parameters eliminates circuit ambiguity which, as can be seen in Figure 1.1, also improves the comparability between di ferent experiments. Moreover, the regions of importance for the respective processes are automatically weight by the parameter-dependence of the models. Additionally, external-parameter dependence enhances the association of circuit components with distinct pieces of the system under investigation and reduces the absorption of deviations, e. g. by an incomplete model on one piece, into the t parameters of another piece. Finally, if the same underlying physical properties are present in di ferent models for the same piece they may be shared and, consequently, tted jointly, even between capacitive and resistive properties.The application of this novel approach on samples with ta-C lms on p-type silicon substrates, with di ferent doping concentration, is only an example. However, as explained below, a carefully chosen one.The analysis of depletion layers in silicon, usually in form of capacitance-voltage measurements, is probably one of the most common applications of immittance spectroscopy in semiconductor physics. In comparison to many other systems investigated by immittance spectroscopy, which often rely on empiric models, depletion layers are relatively well-investigated and -understood phenomena which have theory-based models [138][176, pp. 245-297]. The latter is not only true for the capacitance of a depletion layer, but also for its resistance-voltage characteristic, i. e. its static current-voltage relation [176, pp. , 245-286]. As already explained, the novel approach in this work is based on introducing physical models dependent on external parameters. In the case of the depletion layer, both resistive and capacitive properties are dependent on the external parameter voltage and both models are based on microscopic assumptions (which is what is meant in this work by physical model dependent on external parameters). Voltage-dependent immittance spectra, as those obtained in this work, not only contain the capacitancevoltage information, but also the full resistance-voltage characteristic. Furthermore, the higher number of frequencies in the approach introduced in this work as compared to conventional capacitance-voltage analysis (often only one high-and one low-frequency measurement are performed [138, pp. 321-333, 388-389]) allows distinguishing and potentially identifying di ferent serial parts in the system. This allows identifying...

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AC and DC conductivity of ionic liquid containing polyvinylidene fluoride thin films

et al. 2016

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AC and DC conductivity correlation: The coefficient of Barton–Nakajima–Namikawa relation

Cited by 19 publications

References 42 publications

Comments on frequency dependent AC conductivity in polymeric materials at low frequency regime

Comments on frequency dependent AC conductivity in polymeric materials at low frequency regime

A novel approach of immittance-spectra analysis and how it resolves a decade-old deviation of the Frenkel-Poole model

AC and DC conductivity of ionic liquid containing polyvinylidene fluoride thin films

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