Abundance distributions and dissociations of sputtered aluminum, gallium, and indium cluster ions

King, Fred L.; Ross, Mark M.

doi:10.1016/0009-2614(89)85004-3

Cited by 30 publications

(1 citation statement)

References 28 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This observation is in agreement with the SIMS data of King and Ross. [21 ] which they interpreted to indicate instability of these ions. What is interesting is that the same structure is observed in our neutral cluster data as can be seen in fig.…”

Section: Ion Cluster Stabilitymentioning

confidence: 99%

Sputtering of neutral and ionic indium clusters

Coon

Calaway

et al. 1994

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

View full text Add to dashboard Cite

Secondary neutral and secondary ion cluster yields were measured during the sputtering of a polycrystalline indium surface by normally incident-4keV Ar+ ions. In the secondary neutral mass spectra, indium clusters as large as In32were observed. In the secondary ion mass spectra, indium clusters up to Ini_8were recorded. Cluster yields obtained from both the neutral and ion channel exhibited a power law dependence on the number of constituent atoms, n, in the cluster, with the exponents measured to be-5.6 and-41, respectively. An abundance drop was observed at n=8, 15, and 16 in both the neutral and ion yield distributions suggesting that the stability of the ion (either secondary ion or photoion) plays a significant role in the z observed distributions. In addition, our experiments suggest that unimolecular decomposition of the neutral cluster may also plays an important role in the measured yield distributions.

show abstract

Section: Ion Cluster Stabilitymentioning

confidence: 99%

Sputtering of neutral and ionic indium clusters

Coon

Calaway

et al. 1994

Journal of Vacuum Science &Amp; Technology A: Vacuum, Surfaces, and Films

View full text Add to dashboard Cite

show abstract

New Light on the Chemistry of the Group 13 Metals

Downs¹,

Himmel²

2011

The Group 13 Metals Aluminium, Gallium, Indium and Thallium: Chemical Patterns and Peculiarities

View full text Add to dashboard Cite

Size Distribution Studies of Sputtered Transition Metal Cluster Ions by Fourier Transform Ion Cyclotron Resonance Mass Spectrometry

Selinger

Schnabel

Wiese

et al. 1990

Ber Bunsenges Phys Chem

View full text Add to dashboard Cite

Mass spectra of various metal cluster ions, mainly of transition metals are presented. These clusters were sputtered by an external 20 keV Xe+ ion source and detected with a Fourier transform mass spectrometer (FT‐MS). Cluster ions could be efficiently trapped in the ion cyclotron resonance cell (ICR‐cell). In the case of indium, for instance, clusters containing more than 100 atoms could be observed. The sensitivity of our instrument was sufficient to even detect Au+85 cluster ions with mass 16745 u. “Magic numbers” are observed in the cluster cation distributions of indium and the d10S1 metals copper, silver and gold.

show abstract

Abundance distributions and dissociations of sputtered aluminum, gallium, and indium cluster ions

Cited by 30 publications

References 28 publications

Sputtering of neutral and ionic indium clusters

Sputtering of neutral and ionic indium clusters

New Light on the Chemistry of the Group 13 Metals

Size Distribution Studies of Sputtered Transition Metal Cluster Ions by Fourier Transform Ion Cyclotron Resonance Mass Spectrometry

Contact Info

Product

Resources

About