2008 IEEE International Symposium on Electromagnetic Compatibility 2008
DOI: 10.1109/isemc.2008.4652090
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Absorber loading study in FOI 36.7 m<sup>3</sup> mode stirred reverberation chamber for pulsed power measurements

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Cited by 10 publications
(8 citation statements)
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“…3 for each loading configuration) show the increase of the correlation of the EM field when the amount of loading increases (leading to lower number of uncorrelated samples obtained over one stirrer revolution). These results are in full agreement with the results previously presented in [13]- [15]. However, it is worth noting that for weak loading (until 12 PA for instance), the increase of the correlation is really lowsensitive.…”
Section: Obtained Resultssupporting
confidence: 94%
See 1 more Smart Citation
“…3 for each loading configuration) show the increase of the correlation of the EM field when the amount of loading increases (leading to lower number of uncorrelated samples obtained over one stirrer revolution). These results are in full agreement with the results previously presented in [13]- [15]. However, it is worth noting that for weak loading (until 12 PA for instance), the increase of the correlation is really lowsensitive.…”
Section: Obtained Resultssupporting
confidence: 94%
“…Finally, the influence of the insertion of losses on the number of uncorrelated samples obtained over one stirrer revolution has been studied in recent papers [13]- [15] demonstrating from measurement results that this number is lowered when introducing absorbers in comparison to the case of an empty MSRC.…”
Section: B State-of-the-art About the Loading Effect In A Msrcmentioning
confidence: 97%
“…As opposed to the case of a perturbative effect, it has been highlighted how a strong increase in losses has a negative impact on field statistics, as in [21]. It is noteworthy that in that study the quality factor was reduced by a factor up to ten, thus strongly modifying the reverberation chamber behaviour, whose relationship with the unloaded configuration should be questioned.…”
mentioning
confidence: 87%
“…The lowest value of is 12.7 ns, when the cavity is loaded with 12 units of RAM; therefore, , and so it is reasonable to say . The effect of loading not only has an effect on the time constant, it also potentially effects the number of modes, with greater loading leading to fewer modes [25] and, therefore, a greater LUF. It has also, however, been reported that the opposite effect may happen; for example, Arnaut shows that the LUF is proportional to the third root of the -factor (and, hence, time constant) [26].…”
Section: Investigating the E-field Uniformity In Vehicle Cavitiesmentioning
confidence: 99%