Absolute Spectral Radiation Measurements From 200-ns 200-kA $X$-Pinch in 10-eV–10-keV Range With 1-ns Resolution

Mo x-pinch performance from a new compact and portable 1-kA/ns 2-LTD-Brick driver

“…We briefly discussed the lumped RLC circuit with emphasize on "critically matched" and "matched" load cases and derived some useful expressions, which can be used to estimate the driver time to peak (2.2-14), peak current (2.2-15), peak voltage (2.2-16) and current rise time (2.2-17) and (2.2-18). The last, "matched" load case is more suitable for x-pinch driver design, as it gives a higher peak current (see [2][3][4][5][6][7][8][9][10][11][12][13][14][15] with faster current rate of rise (see 2-17 vs. [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18]. We also derived a few expressions (2.2-21), (2.2-22) and (2.2-23) which can be usefull for driver characterization in short-circuit testing.…”

“…[2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20] with the solution plotted in Figure2.2-5.…”

Warm dense matter study and pulsed-power developments for X-pinch equipment in Nagaoka University of Technology

“…Pulsed-power development for point-spot-like X-ray source generated by X-pinch technique [26] For observing interior of dense plasmas generated by the intense ion beams or the pulsed-power discharges [27][28][29][30][31][32][33], we required intense, point-spot like X-ray source, because of short lifetime, small size and high density of those plasmas. One of the intense, point-spot like X-ray sources is X-pinch technique [34][35][36][37][38][39][40][41].…”