Absolute phase measurement method with few-patterns

Qi, Xingyang; Zhou, Canlin; Ding, Yongling; Si, Shuchun; Li, Hui

doi:10.1117/12.2606774

Cited by 1 publication

(1 citation statement)

References 14 publications

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“…However, since more patterns are designed to be projected, the measurement efficiency is sacrificed in temporal phase unwrapping. On the contrary, the spatial phase unwrapping determines the fringe order by analyzing the relation between the current pixel and its adjacent pixels, and avoids additional projections in the temporal phase unwrapping so it's more suitable for fast measurement [13]. Due to the spatial phase unwrapping heavily relies on the high quality of captured patterns and wrapped phase map, its robustness becomes the most disadvantage in wide applications.…”

Section: Introductionmentioning

confidence: 99%

Measurement depth modeling and extension for geometric constraint phase unwrapping method

2024

International Conference on Optical and Photonic Engineering (icOPEN 2023)

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As an important phase unwrapping method in Fringe Projecting Profilometry, the geometric constraint enables pixel-by-pixel computation while avoiding the projection of additional patterns. However, its measurement depth is limited to one fringe period and influenced by multiple factors from the camera-projector system. There is still a lack of a generalized model that can describe the measurement depth. In this paper, to completely understand the variables related to the measurement depth, we analyze the unwrapping process of geometric constraint and derive a generalized model. To validate the key variables in the model, we establish a virtual camera-projector system and conduct simulations. Based on the simulation results, we propose four ways to extend the measurement depth, including (a) selecting a reference plane farther away from the camera, (b) designing the fringe patterns with fewer periods, (c) using the shorter focal lens and (d) reducing the camera-projector distance.

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Section: Introductionmentioning

confidence: 99%

Measurement depth modeling and extension for geometric constraint phase unwrapping method

2024

International Conference on Optical and Photonic Engineering (icOPEN 2023)

View full text Add to dashboard Cite

show abstract

Absolute phase measurement method with few-patterns

Cited by 1 publication

References 14 publications

Measurement depth modeling and extension for geometric constraint phase unwrapping method

Measurement depth modeling and extension for geometric constraint phase unwrapping method

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