1979
DOI: 10.1063/1.325747
|View full text |Cite
|
Sign up to set email alerts
|

Absolute measurement of low-energy H0 fluxes by a secondary emission detector

Abstract: Secondary negative and positive charge emission coefficients for bombardment of a gas-covered Cu surface by H+, H0, and H− have been measured for projectile energies of ∼25–2500 eV. The secondary negative charge yield for H0 impact was found to be 1.15±0.08 times that for H+ impact. For H− impact, the secondary negative charge yield decreased less rapidly with projectile energy than that of H+ and H0 impact, being about an order of magnitude larger at the lowest energies investigated. The secondary positive ch… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
14
0

Year Published

1987
1987
2016
2016

Publication Types

Select...
6
1
1

Relationship

1
7

Authors

Journals

citations
Cited by 51 publications
(15 citation statements)
references
References 17 publications
1
14
0
Order By: Relevance
“…Carefully designed electrostatic shielding in the experiment by Keller and Cooper 9 ensured the exclusion of stray secondary electrons from enhancing the measured O Ϫ detection efficiency; it was thus concluded that the difference might be due to different secondary electron coefficients for O ϩ and O Ϫ impacting a CEM surface. To this date, this has not been directly measured for oxygenic species, however Ray et al 27 have shown this to be the case for H Ϫ , H, and H ϩ impacting a gas covered Cu surface. Their results indicate that the secondary negative emission ͑the sum of electrons and ions͒ from H Ϫ is nearly an order of magnitude greater than those from H and H ϩ ͑both similar in value͒ for EՇ1000 eV.…”
Section: Resultsmentioning
confidence: 98%
“…Carefully designed electrostatic shielding in the experiment by Keller and Cooper 9 ensured the exclusion of stray secondary electrons from enhancing the measured O Ϫ detection efficiency; it was thus concluded that the difference might be due to different secondary electron coefficients for O ϩ and O Ϫ impacting a CEM surface. To this date, this has not been directly measured for oxygenic species, however Ray et al 27 have shown this to be the case for H Ϫ , H, and H ϩ impacting a gas covered Cu surface. Their results indicate that the secondary negative emission ͑the sum of electrons and ions͒ from H Ϫ is nearly an order of magnitude greater than those from H and H ϩ ͑both similar in value͒ for EՇ1000 eV.…”
Section: Resultsmentioning
confidence: 98%
“…RsC where the y represents the "potential ejection" of electrons and is small for hydrogen ions [6,8,26], the kv term is an approximation to the contribution of "kinetic" ejection of electrons [6,8,26], and the kI term represents the first-order effects of space charge on the electric field and, thereby, the electron yield at the cathode. In the second term of Eq.…”
Section: Model Of Transients In Low-current Dischargesmentioning
confidence: 99%
“…, H in Hz. A near linear variation of yield with Vis typical of electron yields at ion (and neutral atom) energies of the order of 100 eV [26]. The term proportional to I was proposed by Rogowski [16] and assumes that the energy of the ions striking the cathode is determined by the E/n at the cathode, as would be appropriate for ions with a short mean-free path for charge-transfer collisions.…”
Section: Model Of Transients In Low-current Dischargesmentioning
confidence: 99%
See 1 more Smart Citation
“…Finally, it is assumed that the total current and the ion current are related by J t /j i = 1 + γ ef f , where γ ef f is effective value of the electron yield per ion arriving at the cathode [10,84]. The solution to (B.1) can now be expressed as…”
Section: Appendix B Space Charge Effectsmentioning
confidence: 99%