Absolute electron-impact total ionization cross sections of chlorofluoromethanes Absolute partial cross sections for electron-impact ionization of NO and NO 2 from threshold to 1000 eV Absolute partial cross sections for electron-impact ionization of H 2 O and D 2 O from threshold to 1000 eV Absolute partial cross sections for the production of CH 4 ϩ , CH 3 ϩ , CH 2 ϩ , CH ϩ , C ϩ , H 2 ϩ , and H ϩ from electron-impact ionization of CH 4 are reported for electron energies from threshold to 1000 eV. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output demonstrates that all product ions are completely collected. The overall uncertainty in the absolute cross section values is Ϯ3.5% for singly charged parent ions and is slightly greater for fragment ions. Although previous measurements are generally found to agree well with the present results for CH 4 ϩ and CH 3 ϩ , almost all previous work for the remaining fragment ions lies lower than the present results and in the case of H ϩ is lower by approximately a factor of 4.