About two-dimensional fits for the analysis of the scattering rates and renormalization functions from angle-resolved photoelectron spectroscopy data

Abstract

A new method for the analysis of the scattering rates from angle-resolved photoelectron spectroscopy (ARPES) is presented and described in details. It takes into account experimental instrumental resolution and finite temperature effects. More accurate results are obtained in comparison with a standard, commonly used method. The application of the method is demonstrated for several examples commonly encountered in new quantum materials. Its usefulness is especially apparent in investigations of systems with strongly correlated electrons.