Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs

Chae, Myeongsu; Cha, Ho-Young; Kim, Hyungtak

doi:10.1109/jeds.2024.3436820

IEEE J. Electron Devices Soc.

2024

DOI: 10.1109/jeds.2024.3436820

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Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs

Myeongsu Chae,

Ho-Young Cha,

Hyungtak Kim

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Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs

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