Abnormal ESD failure mode with low-voltage turn-on phenomenon of LDMOS output driver

Park, Jaeyoung; Orshansky, Michael

doi:10.1109/irps.2012.6241891

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Abnormal ESD failure mode with low-voltage turn-on phenomenon of LDMOS output driver

Cited by 3 publications

References 12 publications

Analysis of ESD failure due to parasitic vertical NPN opening in integrated circuits with N-substrate process

Analysis of ESD failure due to parasitic vertical NPN opening in integrated circuits with N-substrate process

Failure analysis and optimization for synchronous rectifier Lateral DMOS transistor in DC-DC buck converter

Design of High-ESD Reliability in HV Power pLDMOS Transistors by the Drain-Side Isolated SCRs

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