Aberration-Corrected Transmission Electron Microscopy of the Intergranular Phase in Magnetic Recording Media

Abstract

In perpendicular hard disk memory media, nanometric magnetic Co-rich grains are separated by a ∼1 nm thick nonmagnetic and preferably amorphous intergranular phase (IP). Attempts at observing the IP structure at high resolution using TEM have been obstructed by the superposition of lattice fringes from the crystalline grains extending into the IP region in images. Here we present the first images of a magnetic recording medium produced using a spherical aberration-corrected TEM showing the true amorphous IP structure in contrast to the crystalline grains, allowing the accurate determination of the grain-IP interface and the grain and IP dimensions. It is shown that these aberration-corrected TEM images are functionally superior for analyzing certain features of the ultrahigh capacity data recording media.

Quasi-ZIF-67 for Boosted Oxygen Evolution Reaction Catalytic Activity via a Low Temperature Calcination

“…In the regard of improving the electrochemical activity as well as preserving the porosity to enable mass transfer, modifying MOF with no total decomposition of the framework would expose catalytically active metal sites and accelerate the electron transfer, realizing the abovementioned aims. There are several other methods that produce defects in MOFs, such as acid etching, NaBH 4 reduction, chemical activation. , To reveal the exposed active metal sites in the modified MOF, spherical aberration-corrected transmission electron microscopy (TEM) has been utilized to illustrate the crystalline structures in high resolution, , which cannot be reached by a conventional TEM.…”

“…There are several other methods that produce defects in MOFs, such as acid etching, 14 NaBH 4 reduction, 15 chemical activation. 16,17 To reveal the exposed active metal sites in the modified MOF, spherical aberration-corrected transmission electron micros-copy (TEM) has been utilized to illustrate the crystalline structures in high resolution, 18,19 which cannot be reached by a conventional TEM.…”