2015
DOI: 10.1063/1.4908175
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Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution

Abstract: Atomic-resolution electromagnetic field observation is critical to the development of advanced materials and to the unveiling of their fundamental physics. For this purpose, a spherical-aberration corrected 1.2-MV cold field-emission transmission electron microscope has been developed. The microscope has the following superior properties: stabilized accelerating voltage, minimized electrical and mechanical fluctuation, and coherent electron emission. These properties have enabled to obtain 43-pm information tr… Show more

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Cited by 89 publications
(45 citation statements)
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“…The resolution was later improved further by other aberration-corrected microscopes, and it presently stands at 0.45 Å [37] for STEM and 0.44 Å for (high voltage) CTEM [38]. The subsequent improvements, however, did not change the fact that it was our correction project that first proved that aberration-corrected microscopes could reach higher spatial resolution than any other electron microscope type.…”
mentioning
confidence: 86%
“…The resolution was later improved further by other aberration-corrected microscopes, and it presently stands at 0.45 Å [37] for STEM and 0.44 Å for (high voltage) CTEM [38]. The subsequent improvements, however, did not change the fact that it was our correction project that first proved that aberration-corrected microscopes could reach higher spatial resolution than any other electron microscope type.…”
mentioning
confidence: 86%
“…Electron holography studies using a newly developed high‐voltage (1.2 MV) electron microscope will help elucidate quantum phenomena at high magnification and high resolution. In addition, this high‐voltage electron microscope can be used to observe the interactions between electrons and electromagnetic fields with atomic resolution for relatively thick specimens.…”
Section: Summary and Perspectivesmentioning
confidence: 99%
“…In this way, Gabor's original idea to overcome the resolution limit of an electron microscope has been realized. Using off-axis holography in an aberration-corrected transmission electron microscope a resolution of a few picometers has been demonstrated (Harada, et al, 2004;Akashi, et al, 2015). However, for our purposes, only low resolution holograms are used so that the whole processing of holograms is greatly simplified.…”
Section: Methodsmentioning
confidence: 99%