Ab-initio calculations of corundum structured α-(Al0.75Cr0.22Me0.03)2O3 compounds (Me = Si, Fe, Mn, Ti, V and Y)

Corundum-Structured AlCrNbTi Oxide Film Grown Using High-Energy Early-Arriving Ion Irradiation in High-Power Impulse Magnetron Sputtering

“…The XRD patterns of the AlCrNbTi oxide films grown at different U sync are shown in Fig. 3 where the identical peak positions for this compound also shifts to lower angles as compared with corundum-Al 2 O 3 due to the increased lattice constant [27]. For the films grown with U float and U sync = − 100 V, low peak intensities corresponding to the growth of (110) and (300) planes is seen, revealing low film crystallinity.…”