“…Therefore, we can verify that the present method is an advanced tool for the crystallographic identification of 2D materials, compared to previous methods including TEM, − STM (scanning tunneling microscopy), LEED (low-energy electron diffraction), − POM (polarized optical microscopy) of liquid crystals, − spectroscopic approaches based on nonlinear optical properties, − and direct imaging of epitaxial materials ,,,,− ,− (see Table S2 for details). For example, TEM − and LEED − are suitable only for conductive or ultrathin substrates, POM of liquid crystals cannot measure absolute crystallographic orientations, − and many epitaxial materials cannot be easily removed. ,, One can be concerned that crystallographic identification might become unnecessary because of the recent progress on wafer-scale synthesis of single-crystalline 2D materials. However, wafer-scale single crystals can be synthesized with limited types of 2D materials such as graphene, hBN, and MoS 2 . , Wrinkles of 2D materials are also a main source for disturbing crystallographic control, but wrinkle-minimized synthesis and transfer methods are achieved only for graphene.…”