By the slight adjustment of oxides constituting thin film transistor-liquid crystal display (TFT-LCD) substrate glass, including equal mole fraction substitution of Al
2
O
3
, GeO
2
, B
2
O
3
, P
2
O
5
and ZrO
2
for SiO
2
, as well as the substitution of CaO for SrO with the total contents unchanged, the structural and physico-chemical properties of the glass was investigated by Raman spectroscopy and other measurements. The results showed that the short-range disorder brought by the substitution of GeO
2
, B
2
O
3
and P
2
O
5
for SiO
2
could weaken the stability and compactness of the glass network, and the physico-chemical properties deteriorated, while the process of glass melting would become easier accordingly. The short-range disorder by the substitution of ZrO
2
for SiO
2
with 1% mole fraction showed a little difference with other samples. Finally, the substitution of modified cations, such as CaO and SrO, showed a smaller variation compared with the substitution of network formers. On the condition of 1% mole fraction substitution of oxides investigated, the variation of samples showed a reasonable change and the performance was basically all satisfied for the use of TFT-LCD substrate.