2009
DOI: 10.1088/0022-3727/42/13/135302
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A vector model for analysing the surface photovoltage amplitude and phase spectra applied to complicated nanostructures

Abstract: An approach is presented for comprehensive and reliable analysis of the surface photovoltage (SPV) amplitude and phase spectral behaviour in various semiconductor materials and structures. In this approach the SPV signal is represented as a radial vector with magnitude equal to the SPV amplitude and angle with respect to the x-axis equal to the SPV phase. This model is especially helpful in complicated nanostructures, where more than one SPV formation processes arises during the spectrum run. The value of the … Show more

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Cited by 50 publications
(41 citation statements)
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References 24 publications
(47 reference statements)
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“…The downward dip seen in both phase spectra just below the bandgap is from non-linear effects associated with the dramatic rise in absorption coefficient in this energy range. 22,23 We note that the positive sign of this curvature is opposite to what was previously predicted for a p-type semiconductor. 22 However, this is easily explained by the presence of SCR2: Since the frequency dependent data showed that SCR2 dominates the dynamics below bandgap, the curvature in the phase spectra is no longer that of the surface but of the buried interface, which has the opposite effect on the SPS signal as SCR1.…”
Section: Resultscontrasting
confidence: 63%
“…The downward dip seen in both phase spectra just below the bandgap is from non-linear effects associated with the dramatic rise in absorption coefficient in this energy range. 22,23 We note that the positive sign of this curvature is opposite to what was previously predicted for a p-type semiconductor. 22 However, this is easily explained by the presence of SCR2: Since the frequency dependent data showed that SCR2 dominates the dynamics below bandgap, the curvature in the phase spectra is no longer that of the surface but of the buried interface, which has the opposite effect on the SPS signal as SCR1.…”
Section: Resultscontrasting
confidence: 63%
“…23,36 When U x is used in the SPV experiments, only the net result of charge carrier transfer properties is recorded, but usually at the same time there could be more than one process which can cause the SPV response, such as the built-in electric field, external bias, or Dember effect driven SPV. In order to analyse such complicated SPV processes, a qualitative vector model has been adopted along with the SPV amplitude (U R ) and phase (j) spectra, 34 in which the SPV signal is represented by a radial vector, i.e., the SPV amplitude is represented by the vector magnitude and the SPV phase is represented by the included angle between the SPV vector and the x-axis. If there are two different processes which can result in an SPV response, these two SPV signals will be added according to the rule of vector addition.…”
Section: Characterizationmentioning
confidence: 99%
“…Recently, a new method was proposed based on the surface photovoltage to investigate semiconductor structures including structures with quantum wells . The influence of the Dember EMF should be also taken into account.…”
Section: Introductionmentioning
confidence: 99%