A vector corrected waveform and load line measurement system for large signal transistor characterisation

Abstract

A vector corrected large signal measurement setup based on a Microwave Transition Analyser has been developed to enable device output harmonic: anti waveform measurement with variable drive level, frequency, DC bias and fundamental load impedance. A novel capability of this system is the ability t o plot the device dynamic load lines during measureinent so that nonlinear effects can be investigated as a function of bias and load impedance in real time. Load line results are shown for a MESFET and an HBT device and the effect. of load impedance on device behaviour is described.

Non Linear RF Device Characterization in Time Domain using an Active Loadpull Large Signal Network Analyzer

“…This is the reason why, over the last 18 years, several laboratories and research teams tried to develop and design microwave measurement equipments in order to carry out nonlinear measurements under fifty ohms environment [1][2][3][4]. Due to the fact that nonlinear components must be characterized in an environment close to a realistic condition, for instance with optimum matching for power, there is a need to integrate a novel microwave system in order to perform measurements with load impedances different from fifty ohms [5][6][7]. In this paper, we present the development of an automated active load-pull system based on a Large Signal Network Analyser (LSNA).…”

Theoretical basis for extraction of mildly nonlinear behavioral models

“…However, because the oscilloscope's broad resolution bandwidth led to low system sensitivities, it was then substituted by the harmonic receiver of a vector network analyzer [9] or a combination of both instruments [10]. Nevertheless, it was mainly after the introduction of the microwave transition analyzer [11], which is a vector spectrum analyzer, that the proposed setups led to the current vector nonlinear network analyzer (VNNA or nonlinear measurement system) architectures [12][13][14][15][16]. Since then a large amount of work on possible nonlinear characterization procedures was carried on, despite it not being supported by any theoretical basis [17,18].…”