A UUT-centric test specification simplifies digital functional test development

Eracar, Yonet A.; Lopes, Teresa

doi:10.1109/autest.2005.1609210

Cited by 4 publications

(2 citation statements)

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“…The M/O Library is provided by the manufacturer of the 1/0 library used to communicate with the instrument. In addition to providing an instrument driver for controlling our digital instrument, Teradyne also provides a set of development and debugging tools [1].…”

Section: Single Computer Architecturementioning

confidence: 99%

A Net-Centric Instrument Driver Approach for Multi-Computer System Architectures

Lopes

2006

2006 IEEE Autotestcon

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There is a growing interest among system architects to employ multiple computers. Typically, one central computer runs the test executive and user interface, and other computers control the multiple instrument chassis.This architecture produces complexity regarding the location of the instrument driver and associated development and debugging tools. This paper describes the software architecture for a complex digital test instrument that allows the driver and associated tools to be located with the test executive even though the instrument is resident remotely and controlled by another computer.

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Section: Single Computer Architecturementioning

confidence: 99%

A Net-Centric Instrument Driver Approach for Multi-Computer System Architectures

Lopes

2006

2006 IEEE Autotestcon

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“…The Digital Test Editor [1] associated with Teradyne's new generation of digital test instruments is designed to address the test development constraints described above. The Digital Test Editor, shown in Figure 2, is an integrated graphical toolset that uses a UUT-centric approach for test development, debugging, and code generation of digital functional test.…”

Section: Test Case: Digital Test Editormentioning

confidence: 99%

Integrating a Graphical Instrument Development Environment with an Existing Applications Development Environment and Test Executive

Eracar

2006

2006 IEEE Autotestcon

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The application of automatic test equipment in designing spare parts

Mei

Bin

2008

2008 Ieee Autotestcon

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In this paper, we present the application of automatic test equipment (ATE) in digital circuit boards design. Test validation for spare part boards design using ATE hardware and LASAR software was discussed, and examples were also given. The results showed that the simulating technology was an efficient way for circuitry design and validation, and the use of ATE as the general purpose test and validation platform is feasible. The major requirements for spare part boards design are to satisfy technical parameters and performances requirements and, to build running environment and test environment under the laboratory condition. The primary purpose is to verify that whether the functions and performances of spare part circuit boards are identical to the original circuit board under the same stimulating and operating condition, therefore to ensure the design requirements. Test program sets (TPS) running on ATE are developed on the platform of LASAR simulation software. Since LASAR can be used to simulate the performances of digital circuits, it can also be used in digital circuits design validation, and the development of test program sets.The key technical approach is that, the original circuit board must have passed GO/NOGO TEST [4] on the Spectrum 9023/50 ATE by running corresponding TPS; then the spare part board is tested under the same testing condition; finally, by comparing the test results, the designer is able to find out the problems occurred, analyze the causes and modify designs accordingly.First of all, we describe the approach of designing spare part circuit boards. Then we introduce TPS development work flow on LASAR simulation platform. Finally we will give the practical cases of test application and summarization of the spare part design at the end of this paper.

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A UUT-centric test specification simplifies digital functional test development

Cited by 4 publications

References 0 publications

A Net-Centric Instrument Driver Approach for Multi-Computer System Architectures

A Net-Centric Instrument Driver Approach for Multi-Computer System Architectures

Integrating a Graphical Instrument Development Environment with an Existing Applications Development Environment and Test Executive

The application of automatic test equipment in designing spare parts

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