2020
DOI: 10.1039/c9ee02202c
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A universal solution processed interfacial bilayer enabling ohmic contact in organic and hybrid optoelectronic devices

Abstract: A bilayer of Nb-TiO2 and bathocuproine forms a highly ohmic contact between a wide variety of semiconducting materials and metal electrodes. This enables performance and stability improvements in a range of electronic devices.

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Cited by 46 publications
(42 citation statements)
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References 59 publications
(66 reference statements)
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“…Similar to previously observed trends, [36] the presence of the additional AZO and TPPO layers, in conjunction with PC 60 BM, lead to an enhancement in solar cell operational stability. As shown in Figure S4 (Supporting Information), in the case of PC 60 BM alone, T 80 (the time for the solar cell to reach 80% of its original PCE) is reached after 300 h. In contrast, the addition of AZO raises this time to 550 h, with the device benefitting from a reduction in metal electrode migration through the ETL and into the perovskite.…”
Section: Device Characterizationsupporting
confidence: 88%
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“…Similar to previously observed trends, [36] the presence of the additional AZO and TPPO layers, in conjunction with PC 60 BM, lead to an enhancement in solar cell operational stability. As shown in Figure S4 (Supporting Information), in the case of PC 60 BM alone, T 80 (the time for the solar cell to reach 80% of its original PCE) is reached after 300 h. In contrast, the addition of AZO raises this time to 550 h, with the device benefitting from a reduction in metal electrode migration through the ETL and into the perovskite.…”
Section: Device Characterizationsupporting
confidence: 88%
“…Moreover, enhanced EQE response is observed at longer wavelengths (>700 nm) for PC 60 BM/ AZO and especially for PC 60 BM/AZO/TPPO cells, which suggests reduced recombination at the "rear" side of the cell, i.e., interface between perovskite and ETL. [36] The integrated photocurrent density for the PC 60 BM, PC 60 BM/AZO, and PC 60 BM/ AZO/TPPO solar cells is 19.5, 20.6, and 20.9 mA cm −2 , respectively, in good agreement with the J SC values obtained from the J-V plots in Figure 1d. Moreover, the statistical data collected from over 20 cells ( Figure S3, Supporting Information) indicate that that triple-ETL not only improves the overall device performance, but also narrows the spread of all device parameters, which highlights the effectiveness of the new multilayer ETL to improve the reproducibility of the device manufacturing.…”
Section: Device Characterizationsupporting
confidence: 82%
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