2022
DOI: 10.1109/access.2022.3193639
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A Unified NVRAM and TRNG in Standard CMOS Technology

Abstract: This work is based on results obtained from a project JPNP16007, commissioned by the New Energy and Industrial Technology Development Organization (NEDO).

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Cited by 5 publications
(4 citation statements)
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References 45 publications
(42 reference statements)
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“…The possibility of switching the I SC polarity can pave the way for a novel self‐powered, non‐volatile memory device, whereas generally, a drain bias of several volts is used for the reading. [ 62 ] Figure 6d illustrates the proposed working principle of such a memory device with electrical writing and photovoltaic reading, where V g = −80 V and V g = +80 V represent a logic “0” and “1,” respectively. Despite the applied gate pulse, there is no output signal in dark conditions due to the absence of I SC .…”
Section: Resultsmentioning
confidence: 99%
“…The possibility of switching the I SC polarity can pave the way for a novel self‐powered, non‐volatile memory device, whereas generally, a drain bias of several volts is used for the reading. [ 62 ] Figure 6d illustrates the proposed working principle of such a memory device with electrical writing and photovoltaic reading, where V g = −80 V and V g = +80 V represent a logic “0” and “1,” respectively. Despite the applied gate pulse, there is no output signal in dark conditions due to the absence of I SC .…”
Section: Resultsmentioning
confidence: 99%
“…Extensive use of the existing SRAM array infrastructure allows for the integration of the entire key generation subsystem with only a 12.7% increase in area compared to a baseline SRAM [157]. The study, introduced a unified NVRAM-TRNG that employs high-voltage transistors to withstand the voltage requirements during the program and erase operations in NVRAM mode [158]. To capture jitter noise utilizes a single ring oscillator (RO) divided into two interconnected stages.…”
Section: A Hardware Security Modules: 1) True Random Number Generator...mentioning
confidence: 99%
“…The balanced latches are used for a TRNG application. However, the process variations impose problems when balancing the latch, which require a calibration step [7,20,21]. On the other hand, the unbalanced latches produce a stable and unique response.…”
Section: Physical Phenomenamentioning
confidence: 99%
“…For example, a static random access memory (SRAM) can be used to generate a TRNG-PUF, exploiting the bit line's time response and leakage current [4][5][6]. In addition, a TRNG and a non-volatile random access memory (NVRAM) can be unified, exploiting the metastability in the sense amplifier [7] or reading the bit cell noise [8]. On the other hand, a PUF-NVRAM is unified using the initial charges into the floating gates' bit cells [9].…”
Section: Introductionmentioning
confidence: 99%