2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 2017
DOI: 10.23919/sispad.2017.8085272
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A unified aging model with recovery effect and its impact on circuit design

Wai-Kit Lee
1
,
Kasa Huang
2
,
Li Chung Hsu
3
et al.
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TCAD calibration for FinFET reliability predictions

Jha
1
,
Hoque
2
,
Manahile
3
et al. 2022
2022 IEEE International Integrated Reliability Workshop (IIRW)
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TCAD calibration for FinFET reliability predictions

Jha
1
,
Hoque
2
,
Manahile
3
et al. 2022
2022 IEEE International Integrated Reliability Workshop (IIRW)
1
0
1
0
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Utilizing a Thorough Understanding of Critical Aging and Failure Mechanisms in finFET Technologies to Enable Reliable High Performance Circuits

Weir
1
,
Prasad
2
,
Moinian
3
et al. 2019
2019 IEEE International Reliability Physics Symposium (IRPS)
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Aging -aware Path Timing Prediction via Graph Representation Learning

Jia,
Jiang,
Liang
et al. 2024
2024 2nd International Symposium of Electronics Design Automation (ISEDA)
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