A two-non-identical-unit parallel system with correlated lifetimes

Gupta, Rakesh; Kishan, Ram; Kumar, Pawan

doi:10.1080/002077299291741

Cited by 7 publications

(2 citation statements)

References 4 publications

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“…For instance, Epstein and Sobel (1953), Meyer (1965), Anderson, Sweeney, and Williams (1990), Keller, Warrack, and Bartel (1994) and Gupta, Kishan, and Kumar (1999) pointed out that the product lifetime possesses an exponential distribution. Meyer (1965), Wu, Lin, Tan, and Lee (2000), Wu (2002) and Giri, Jalan, and Chaudhuri (2003) noted that Weibull distribution is used to describe the lifetime distribution.…”

Section: Introductionmentioning

confidence: 97%

Implementing lifetime performance index of products with two-parameter exponential distribution

Lee

Lei

et al. 2011

International Journal of Systems Science

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The manufacturing industry has prioritised enhancing the quality, lifetime and conforming rate of products. Process capability indices (PCIs) are used to measure process potential and performance. The process capability is evaluated with product survival time and a longer lifetime implies a better process capability and a higher reliability. In order to save experimental time and cost, a censored sample arises in practice. In the case of product possessing a two-parameter exponential distribution, this study constructs a uniformly minimum variance unbiased estimator (UMVUE) of the lifetime performance index based on the type II right-censored sample. Then the UMVUE of the lifetime performance index is utilised to develop the new hypothesis testing procedure in the condition of known lower specification limit. Finally, two practical examples are illustrated to employ the testing procedure to determine whether the product is reliable.

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Section: Introductionmentioning

confidence: 97%

Implementing lifetime performance index of products with two-parameter exponential distribution

Lee

Lei

et al. 2011

International Journal of Systems Science

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“…Agnihotri and Satsangi (1996) analyzed two distinct parallel units system with priority based repair, inspection and post repair. Gupta et al (1999) used regenerative point technique for studying the system in which the failure times of two dissimilar operating parallel units are correlated. Kumar et al (2012) analyzed system having priority unit and non priority unit arranged in a parallel configuration.…”

Section: Introductionmentioning

confidence: 99%

Reliability Measures of Two Dissimilar Units Parallel System Using Gumbel-Hougaard Family Copula

Chopra

Ram

2019

Int J Math, Eng, Manag Sci

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The goal of the present study is to investigate the availability and the reliability of the system, which has two dissimilar units in the parallel network under copula. Other key parameters, such as mean time to failure (MTTF) and expected profit are also evaluated. Simultaneous malfunctioning of units, common cause failure and human fault are the causes of system breakdown. The present mathematical model is examined under the assumption that each failure rate is constant and is exponentially distributed. The system undergoes repair in the completely failed state as well as in degraded state. In the case of complete failure, the system is repaired by two repair facilities and that are tackled by utilizing Gumbel-Hougaard family copula. The present system has been studied by applying the concepts of probability theory, supplementary variable technique and Laplace transformation.

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Some Discrete Parametric Markov–Chain System Models to Analyze Reliability

Gupta

Ali

2023

Industrial and Applied Mathematics

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A two-non-identical-unit parallel system with correlated lifetimes

Cited by 7 publications

References 4 publications

Implementing lifetime performance index of products with two-parameter exponential distribution

Implementing lifetime performance index of products with two-parameter exponential distribution

Reliability Measures of Two Dissimilar Units Parallel System Using Gumbel-Hougaard Family Copula

Some Discrete Parametric Markov–Chain System Models to Analyze Reliability

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