2017
DOI: 10.1007/s12633-017-9648-4
|View full text |Cite
|
Sign up to set email alerts
|

A Tunneling Current Model with a Realistic Barrier for Ultra-Thin High-k Dielectric ZrO2 Material Based MOS Devices

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
3
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 18 publications
(3 citation statements)
references
References 29 publications
0
3
0
Order By: Relevance
“…For these emerging devices, materials that possess a higher k of 40–100 and wide band gaps between 4 and 8 eV are desired. , Unfortunately a trade-off is being observed in most dielectric oxides, where increases in the band gap are often found to lead to a decreased dielectric constant . Furthermore, novel high -k nanomaterials should also ideally be stable under conditions encountered during CMOS manufacturing to enable integration with conventional semiconductors such as Si or GaAs. ,, …”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…For these emerging devices, materials that possess a higher k of 40–100 and wide band gaps between 4 and 8 eV are desired. , Unfortunately a trade-off is being observed in most dielectric oxides, where increases in the band gap are often found to lead to a decreased dielectric constant . Furthermore, novel high -k nanomaterials should also ideally be stable under conditions encountered during CMOS manufacturing to enable integration with conventional semiconductors such as Si or GaAs. ,, …”
Section: Introductionmentioning
confidence: 99%
“…7 Furthermore, novel high-k nanomaterials should also ideally be stable under conditions encountered during CMOS manufacturing to enable integration with conventional semiconductors such as Si or GaAs. 3,19,20 Two recent works elucidated the dielectric properties of antimony oxide that was prepared using the chemical vapor deposition (CVD) synthesis method at relatively high temperatures of 550 and 750 °C. 16,21 Surprisingly, one report suggested that the α-Sb 2 O 3 is a low-k dielectric material, whereas the other presented as a high dielectric wide band gap oxide.…”
Section: Introductionmentioning
confidence: 99%
“…Hafnium oxide is employed as a promising gate oxide material because of its excellent interface with Si, high-k value (22), big bandgap (5.6 eV), and conduction band offset (1.4 eV) with regard to Si. Most significantly, a decent electrical interaction with Si makes it a prospective alternative to silicon dioxide [17][18][19][20][21].…”
Section: Structural Dimensions Ie W mentioning
confidence: 99%