A transmission x-ray microscope based on secondary-electron imaging

Watts, R. N.; Liang, Siyi; Levine, Zachary H.; Lucatorto, Thomas B.; Polack, F.; Scheinfein, M. R.

doi:10.1063/1.1148309

Cited by 24 publications

(7 citation statements)

References 25 publications

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“…Our condition Eq. ͑5͒ is slightly different from that derived by Watts et al 8 since our aperture is located behind the transfer lens and not the objective lens. Figure 6 shows the energy distribution of the transmitted electrons for various aperture diameters, for a sample voltage of 20 kV and W f ϭ4 eV.…”

Section: Peem2 Electron Optical Propertiescontrasting

confidence: 68%

“…The properties of the objective lens were calculated in the absence of the accelerating field. Since image formation in PEEM has been described in detail elsewhere, 4,8 we mention it only briefly here. The accelerating field forms a virtual image of the object with unity magnification at a distance of 2l (zϭϪl) from the objective lens where l is the distance between the sample and the first electrode of the objective lens.…”

Section: Peem2 Electron Optical Propertiesmentioning

confidence: 99%

“…The refinement of LEEM by Bauer 5 and the coupling of PEEM with synchrotron radiation by Tonner 6,7 has resulted in a resurgence of interest in this area over the past few years. This has led to the construction of PEEMs by several groups [6][7][8][9][10][11][12] as well as the introduction of commercial systems. Our motivation in developing the instrument reported here was to construct a system for spectromicroscopic imaging of magnetic surfaces near the theoretical resolution limit for this type of microscope.…”

Section: Introductionmentioning

confidence: 99%

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Photoemission electron microscope for the study of magnetic materials

Anders

Padmore

Duarte

et al. 1999

Review of Scientific Instruments

188

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The design of a high resolution photoemission electron microscope ͑PEEM͒ for the study of magnetic materials is described. PEEM is based on imaging the photoemitted ͑secondary͒ electrons from a sample irradiated by x rays. This microscope is permanently installed at the Advanced Light Source at a bending magnet that delivers linearly polarized, and left and right circularly polarized radiation in the soft x-ray range. The microscope can utilize several contrast mechanisms to study the surface and subsurface properties of materials. A wide range of contrast mechanisms can be utilized with this instrument to form topographical, elemental, chemical, magnetic circular and linear dichroism, and polarization contrast high resolution images. The electron optical properties of the microscope are described, and some first results are presented.

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Section: Peem2 Electron Optical Propertiescontrasting

confidence: 68%

Section: Peem2 Electron Optical Propertiesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Photoemission electron microscope for the study of magnetic materials

Anders

Padmore

Duarte

et al. 1999

Review of Scientific Instruments

188

View full text Add to dashboard Cite

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“…These apertures reduce the acceptance angle for the photoelectrons with respect to their lateral momentum component. Consequently, the transmission decreases with higher photoelectron energy, which may according to Watts et al [85] be expressed by (14.17) where C is dependent on the PEEM geometry and W a is the photoelectron energy. The interplay of space charge effects and transmission poses constraints on the maximum applicable XUV intensity [86,87].…”

Section: Experimental Implementation Of the Attosecond Nanoscopementioning

confidence: 99%

Attosecond Nanophysics

Süßmann

Stebbings

Zherebtsov

et al. 2014

Attosecond and XUV Physics

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IntroductionUltrafast control of electronic motion in isolated atoms with light fields has led to the birth of attosecond pulses [1,2]. Waveform-controlled, optical, few-cycle laser pulses are powerful tools to steer electrons on subfemtosecond timescales and have been successfully applied to control the electron emission from atoms [3] and the electron localization in molecules [4]. The realization of a similar level of control of the electron motion in nanocircuits has the potential to revolutionize modern electronics by enabling significantly higher computation and communication speeds [5,6].Worldwide communication relies on optical fiber networks. Data encoding and decoding, however, involves the transformation of photon-based information within the optical fibers to electronic information and vice versa and is thus the current bottleneck for ultrafast communication and information processing. Lightwavecontrolled nanocircuits (lightwave nanoelectronics) [7] are expected to reach petahertz operating frequencies which would remove the bottleneck in conventional communication technology by enabling all-optical data processing and communication. The key challenges on the way to lightwave nanoelectronics are (1) the control of electrodynamics in nanostructured materials on subcycle timescales and (2) the ability to monitor the resulting currents in nanostructured circuits with attosecond time and nanometer spatial resolution [6,[8][9][10][11]. The development and utilization of attosecond metrologies for the control and observation of ultrafast electron dynamics in nanosystems is therefore an issue with far-reaching implication. This chapter discusses selected key concepts and fundamental experiments in this area of attosecond nanophotonics.The central objective of attosecond nanophotonics is the utilization of the widely tunable optical properties of nanostructured materials. This idea, which has a long history, might be illustrated best by the special optical phenomena arising from small nanoparticles. Without deeper insight, already the makers of color-stained glass church windows in the middle ages used the properties of metallic nanoparAttosecond and XUV Physics, First Edition. Edited by Thomas Schultz and Marc Vrakking.

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“…For E/U<<1, an approximate formula based on eq. (1) can be derived [6] Assuming that the diverging aperture lens is very weak so that the acceleration field can be simplified as a planar emission cathode, the aberration formulae for the acceleration field are as given in Eq. (1) and Eq.(2).…”

Section: Modelmentioning

confidence: 99%

Modeling the acceleration field and objective lens for an aberration corrected photoemission electron microscope

Feng

Padmore

Wei³

et al. 2002

Review of Scientific Instruments

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The modeling of the optical properties of the acceleration field and objective lens of a photoemission electron microscope is presented. Theory to calculate the aberrations of the extraction field was derived, and extended to include relativistic effects. An analysis of the microscopes electron optical performance and aberrations has been performed using an analytical model as well as a raytracing method. Raytracing has the flexibility needed for the assessment of aberrations where the geometry is too complex for analytical methods. This work shows that in the case of a simple PEEM front end of the acceleration gap and objective lens, the all orders raytracing and full analytical treatments agree to very high precision. This allows us now to use the raytracing method in situations where analytical methods are difficult, such as an aberration compensating electron mirror.

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A transmission x-ray microscope based on secondary-electron imaging

Cited by 24 publications

References 25 publications

Photoemission electron microscope for the study of magnetic materials

Photoemission electron microscope for the study of magnetic materials

Attosecond Nanophysics

Modeling the acceleration field and objective lens for an aberration corrected photoemission electron microscope

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