1982
DOI: 10.1002/pssa.2210720131
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A Transmission Electron Microscope Study of the Chalcocite–Djurleite Transformation in Topotactically Grown Thin Films of CuxS

Abstract: A study is made of both the phases present in, and the microstructural features of, CuxS films grown topotactically on the (1120) face of a CdS single crystal using the solid state reaction. The as‐grown film is lower chalcosite but djurleite forms during oxidation at room temperature. Eventually it replaces all the lower chalcosite in the region of the CuxS layer not supported by CdS. However, where the CuxS layer is in direct contact with CdS, it consists of djurleite and lower chalcosite even after 1400 h a… Show more

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Cited by 4 publications
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“…The observed defects along the APBs (Figure 8b) are evidence in support of low-temperature transformation of the precursor digenite into either monoclinic chalcocite or djurleite at <103.5 • C and <93 • C, respectively [34]. The chalcocite-djurleite transformation may be continuous across lattice fringes and preserves stacking faults in the djurleite, as documented experimentally on Cu x S films [48].…”
Section: Evolution Of Sulphide Assemblagessupporting
confidence: 71%
“…The observed defects along the APBs (Figure 8b) are evidence in support of low-temperature transformation of the precursor digenite into either monoclinic chalcocite or djurleite at <103.5 • C and <93 • C, respectively [34]. The chalcocite-djurleite transformation may be continuous across lattice fringes and preserves stacking faults in the djurleite, as documented experimentally on Cu x S films [48].…”
Section: Evolution Of Sulphide Assemblagessupporting
confidence: 71%