A Time-Domain Technique for Computation of Noise-Spectral Density in Linear and Nonlinear Time-Varying Circuits

Vasudevan, V.

doi:10.1109/tcsi.2003.822553

Cited by 19 publications

(22 citation statements)

References 41 publications

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“…Given the branch sideband correlation matrix contribution expression (22), we may now derive the contribution to the nodal sideband correlation matrix in (11). Referring to (5), we have that (23) We thus observe from (23) that each block of the nodal correlation matrix corresponds to the nodal admittance of a network where the branch sideband correlation matrix represents the equivalent branch admittance matrix [29].…”

Section: Source Contribution To the Nodal Sideband Correlation Matrixmentioning

confidence: 99%

“…The specific aspects of large-size circuit issue were first taken care in [9] for the periodic excitation and then a [10] for the multitone excitation; however, it did not explicitly state the noise adjoint system solution problem and address the processing of all types of noise source equations encountered in current transistor modeling. More recently there is a number of published works [11]- [13] on noise analysis methods, but these propose rather macromodeling strategies on top of the classical time-domain non Monte Carlo noise analysis methods [6] and focus mainly on the category of circuits lacking waveform periodicity like analog-to-digital converters. Thus, this paper proposes a thorough discussion of the noise analysis algorithm for an effective calculation of noise response in large-size RFICs, under multitone excitation and covering all types of device noise source models.…”

Section: Introductionmentioning

confidence: 99%

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On the Cyclostationary Noise Analysis in Large RF Integrated Circuits

Ngoya

2011

IEEE Trans. Circuits Syst. I

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International audienceThis paper examines the issue of noise analysis in RF integrated circuits (RFICs). The complexity of the RFIC grows constantly, with transistor counts now into the thousands or tens of thousands. Since RFICs are driven by large-signal multitone excitations, the stochastic noise process in these circuits is cyclostationary. This combination of large device count and noise cyclostationarity makes noise analysis in RFICs a time-consuming task. Simulation algorithms that minimize computer memory consumption and computation cost are thus necessary. There is a consensus now that harmonic balance is the most appropriate circuit equation solution method for multitone analysis of RF circuits. The paper thus gives a comprehensive description of a harmonic balance-based algorithm for computing the circuit noise response, showing how it effectively accounts for all types of cyclostationary noise sources supported by modern compact device models. The algorithm has been implemented in a commercial simulator and shows good capabilities for the analysis of full transceiver circuits within reasonable computer memory occupancy and simulation times

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Section: Source Contribution To the Nodal Sideband Correlation Matrixmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

On the Cyclostationary Noise Analysis in Large RF Integrated Circuits

Ngoya

2011

IEEE Trans. Circuits Syst. I

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“…Noise limitations pose a rudimentary issue for the robust circuit design and its evaluation has been subject of numerous studies [1]- [3]. The most important types of electrical noise sources (thermal, shot, and flicker noise) in passive elements and integrated circuit devices have been investigated extensively, and appropriate models have been derived [1] as stationary and in [4] as nonstationary noise sources.…”

Section: Introductionmentioning

confidence: 99%

Noise analysis of non-linear dynamic integrated circuits

Zjajo

Tang

Berkelaar

et al. 2010

IEEE Custom Integrated Circuits Conference 2010

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Abstract--A time-domain methodology for noise analysis of non-linear dynamic integrated circuits with arbitrary excitations is presented. A non-stationary stochastic noise process is described as an Ito system of stochastic differential equations and a numerical solution for such a set of equations is found. Statistical simulation of specific circuits fabricated in 65 nm CMOS process shows that the proposed numerical methods offer accurate and efficient solution of stochastic differentials for noise analysis of integrated circuits.

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“…Several models have been suggested for device variability [6]- [8] and for noise [9]- [12], and correspondingly, a number of computer-aided design (CAD) tools for statistical circuit simulation [13]- [18] and noise analysis [9], [19], [20]. Monte Carlo analysis is a widespread approach for statistical analysis of circuits affected by technological variations and/or noise simulation in time domain.…”

mentioning

confidence: 99%

Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs

Zjajo

Tang

Berkelaar

et al. 2011

IEEE Trans. Circuits Syst. I

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Abstract-A time-domain methodology for statistical simulation of nonlinear dynamic integrated circuits with arbitrary excitations is presented. The statistical behavior of the circuits is described as a set of stochastic differential equations rather than estimated by a population of realizations and Gaussian closure approximations are introduced to obtain a closed form of moment equations. Statistical simulation of specific circuits shows that the proposed numerical methods offer accurate and efficient solution of stochastic differentials for variability and noise analysis of integrated circuits.

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A Time-Domain Technique for Computation of Noise-Spectral Density in Linear and Nonlinear Time-Varying Circuits

Cited by 19 publications

References 41 publications

On the Cyclostationary Noise Analysis in Large RF Integrated Circuits

On the Cyclostationary Noise Analysis in Large RF Integrated Circuits

Noise analysis of non-linear dynamic integrated circuits

Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs

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