A through‐focus scanning optical microscopy dimensional measurement method based on deep‐learning classification model

Abstract

Through-focus scanning optical microscopy (TSOM) is an economical, noncontact and nondestructive method for rapid measurement of three-dimensional nanostructures. There are two methods using TSOM image to measure the dimensions of one sample, including the library-matching method and the machine-learning regression method. The first has the defects of small measurement range and strict environmental requirements; the other has the disadvantages of feature extraction method greatly influenced by human subjectivity and low measurement accuracy. To solve the problems above, a TSOM dimensional measurement method based on deep-learning classification model is proposed.TSOM images are used to train the ResNet50 and DenseNet121 classification model respectively in this paper, and the test images are used to test the model, the classification result of which is taken as the measurement value. The test results showed that with the number of training linewidths increasing, the mean square error (MSE) of the test images is 21.05 nmš for DenseNet121 model and 31.84 nmš for ResNet50 model, both far lower than machine-learning regression method, and the measurement accuracy is significantly improved. The feasibility of using deep-learning classification model, instead of machine-learning regression model, for dimensional measurement is verified, providing a theoretical basis for further improvement on the accuracy of dimensional measurement.

3D microscopy in industrial measurements

“…Another nondestructive optical metrology technique, through-focus scanning optical microscopy, is highly sensitive and suitable for nanostructure measurements. 93,94 The method has promising application prospects for highaspect-ratio microstructure measurements. 95,96 The measurement method extracts the size information of the structure by matching the optical simulation data library and defocused images captured along the scanning direction.…”

“…Another nondestructive optical metrology technique, through‐focus scanning optical microscopy, is highly sensitive and suitable for nanostructure measurements 93,94 . The method has promising application prospects for high‐aspect‐ratio microstructure measurements 95,96 .…”