A theory of 1f noise at semiconductor surfaces

Jäntsch, O.

doi:10.1016/0038-1101(68)90088-9

Cited by 27 publications

(7 citation statements)

References 36 publications

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“…Studies of current noise in semiconductors [4][5][6][7] and in thick film resistors g have been carried out. The explanations deduced from these studies are scattered and restricted to some specified material only.…”

Section: Introductionmentioning

confidence: 99%

Current Noise of Resin Type and Cermet Type Thick Film Resistors

Shiramatsu

1980

Active and Passive Electronic Components

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The current noise indices (C.N.I.) depend linearly on the logarithmic values of sheet resistivity(log⁡ ρS), in both carbon black/resin and thallium oxide/glass resistors, and can be expressed asC.N.I. = A + B log⁡ ρS. The geometrical dependency on C.N.I. in both types of resistor can be expressed asC.N.I. = A′ − B′ log⁡ (L, W, T), whereA,B,A′ andB′ are constants. The dependency of noise e.m.f. (νn) on the applied dc voltage (V), i.e., the values ofαinνn2¯∝Vα, can be obtained from the slope of C.N.I. versuslog⁡ (L)lines, associated with a model based on the noise generator approximation.

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Section: Introductionmentioning

confidence: 99%

Current Noise of Resin Type and Cermet Type Thick Film Resistors

Shiramatsu

1980

Active and Passive Electronic Components

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“…If we assume that all multipath components have doppler frequencies centered around u>i 0 and increase by an increment of Awi 0 , it can be shown that the doppler contribution is equivalent to exp(jui 0 t/2) sm } inAl l i JI 2 . Thus, the contribution of doppler is equivalent to a sine function whose first zero occurs about Auio{LM)t/2 = 7T which corresponds to t = 2ir/(Au>i 0 (LM)) = 1//, where /, is the total doppler spread (/, = (Z,M)AW/(2JT)).…”

Section: -15mentioning

confidence: 99%

“…The object was 1 or more point objects. A point object at position x 0 , y 0 , z 0 would be represented by a spherical wave <p 0 …”

Section: Numerical Simulationmentioning

confidence: 99%

“…The covariance matrix $ can be expressed as 34-9 $ = $<* + $, + $ T (9) which represents the sum of the covariance matrices of desired signal, interference, and noise components. It is assumed that the interference, desired signal, and noise all have rectangular spectral densities centered at the radar operating frequency w 0 and with spread Au; so that AUJ/U 0 represent the relative bandwidth B of all three signals. Some of the useful parameters needed in this study are §d = u 0 Td which represents the interelement phase shift, and $, = w 0 r,-.…”

Section: Dmk(t) = D(t -(K -1)a -(M -L)t D ) (4) Imk{t) = I{t -(K -L)amentioning

confidence: 99%

“…It is assumed that the interference, desired signal, and noise all have rectangular spectral densities centered at the radar operating frequency w 0 and with spread Au; so that AUJ/U 0 represent the relative bandwidth B of all three signals. Some of the useful parameters needed in this study are §d = u 0 Td which represents the interelement phase shift, and $, = w 0 r,-. Let A 90 be the time delay required to produce a 90 degrees phase shift A 90 = 5^, and r is chosen such that A r = (10)…”

Section: Dmk(t) = D(t -(K -1)a -(M -L)t D ) (4) Imk{t) = I{t -(K -L)amentioning

confidence: 99%

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