A Test Beamline on Diamond Light Source

Sawhney, Kawal; Dolbnya, Igor P.; Tiwari, M. K.; Alianelli, Lucia; Scott, Stewart M.; Preece, G.; Pedersen, U.; Walton, Robert

doi:10.1063/1.3463220

Cited by 114 publications

(57 citation statements)

References 1 publication

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“…Studying this sensor region requires a position resolution O(µm), which was achieved by using a micro-focused X-ray beam (2 × 3 µm 2 ) and µm precision positioning stages at the Diamond Light Source beamline B16 [5].…”

Section: Methodsmentioning

confidence: 99%

Studying signal collection in the punch-through protection area of a silicon micro-strip sensor using a micro-focused X-ray beam

Poley

Bates

Bloch

et al. 2019

Nuclear Instruments and Methods in Physics Research Section A:

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For the Phase-II Upgrade of the ATLAS detector [1], a new, all-silicon tracker will be constructed in order to cope with the increased track density and radiation level of the High-Luminosity Large Hadron Collider. While silicon strip sensors are designed to minimise the fraction of dead material and maximise the active area of a sensor, concessions must be made to the requirements of operating a sensor in a particle physics detector. Sensor geometry features like the punch-through protection deviate from the standard sensor architecture and thereby affect the charge collection in that area. In order to study the signal collection of silicon strip sensors over their punch-through-protection area, AT-LAS silicon strip sensors were scanned with a micro-focused X-ray beam at the Diamond Light Source. Due to the highly focused X-ray beam (2 × 3 µm 2 ) and the short average path length of an electron after interaction with an X-ray photon (≤ 2 µm), local signal collection in different sensor areas can be studied with high resolution. This study presents results of high resolution 2D-scans of the punch-through protection region of ATLAS silicon micro-strip sensors, showing how far the strip signal collection area extends toward the bias ring and how the region is affected by radiation damage.

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Section: Methodsmentioning

confidence: 99%

Studying signal collection in the punch-through protection area of a silicon micro-strip sensor using a micro-focused X-ray beam

Poley

Bates

Bloch

et al. 2019

Nuclear Instruments and Methods in Physics Research Section A:

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“…Diamond Light Source's B16 bending magnet test beamline [15] was used to perform a proof-of-concept experiment. A white beam in-line phase imaging geometry was employed, as shown in figure 4.…”

Section: Methodsmentioning

confidence: 99%

An iterative method for near-field Fresnel region polychromatic phase contrast imaging

Carroll

Riessen

Balaur

et al. 2017

J. Opt.

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We present an iterative method for polychromatic phase contrast imaging that is suitable for broadband illumination and which allows for the quantitative determination of the thickness of an object given the refractive index of the sample material. Experimental and simulation results suggest the iterative method provides comparable image quality and quantitative object thickness determination when compared to the analytical polychromatic transport of intensity and contrast transfer function methods. The ability of the iterative method to work over a wider range of experimental conditions means the iterative method is a suitable candidate for use with polychromatic illumination and may deliver more utility for laboratory-based x-ray sources, which typically have a broad spectrum.

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“…The beam-line B16 [13] at the Diamond Light Source in Oxfordshire was used to study the detector by X-ray beam induced current (XBIC). The beam-line produced a monochromatic beam of photons with an energy of 15 keV, and had a full width half maximum (FWHM) of 5 µm.…”

Section: Photon Test Beam Datamentioning

confidence: 99%

Study of a 3D diamond detector with photon and proton micro-beams

Forcolin

Grilj

Hamilton

et al. 2016

Diamond and Related Materials

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To form a 3D diamond detector electrodes were produced in diamond by a femtosecond laserinduced phase transition of diamond to graphite. The process parameters were varied to study the influence on electrode resistivity and induced stress. A technique for a relative measurement of stress induced in 3D diamond detectors is described. The detector was characterised with a 15 keV photon micro-beam (Diamond Light Source, Oxford) and a 4 MeV proton micro-beam (Ruđer Bosković Institute, Zagreb). The detector shows characteristics consistent with full charge collection. Spatially resolved transient current measurements were obtained with protons for the first time, and the results were compared to simulations of the detector.

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A Test Beamline on Diamond Light Source

Cited by 114 publications

References 1 publication

Studying signal collection in the punch-through protection area of a silicon micro-strip sensor using a micro-focused X-ray beam

Studying signal collection in the punch-through protection area of a silicon micro-strip sensor using a micro-focused X-ray beam

An iterative method for near-field Fresnel region polychromatic phase contrast imaging

Study of a 3D diamond detector with photon and proton micro-beams

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