A Systematic Bit Selection Method for Robust SRAM PUFs

Wang, Wendong; Singh, A.D.; Guin, Ujjwal

doi:10.1007/s10836-022-06006-x

Cited by 8 publications

(5 citation statements)

References 28 publications

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“…These stable bits are then used to create the unique challenge-response pairs (CRPs) during the enrollment phase. Several algorithms are used to select stable bits such as the Temporal Majority Voting algorithm (TMV) [23], Neighborhood-based Bit Selection (NBS) [39], the Data Remanence Analysis (DRA) [24], and Systematic Selection method (SS) [38]. The TMV approach focuses on observing the stability of individual bitcells during the power-up process.…”

Section: ) Sram Processingmentioning

confidence: 99%

“…Finally, the SS method aims to control the power supply ramp rate in order to identify the cells in the SRAM that are strongly biased, thereby resistant to circuit noise, voltage and temperature changes. Strong bit selection in [39], [23], and [38] requires complex and exhaustive experiments and analysis in order to determine the best parameters and thresholds. In addition, the experimental results are sensitive to variations in these environmental factors and the power supply rates, which could affect the reliability and robustness of the selected stable cells.…”

Section: ) Sram Processingmentioning

confidence: 99%

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PufParkChain: Secure and Smart Parking Based on PUF Authentication and Lightweight Blockchain

Turki,

Dammak,

Alshahrani

2024

IEEE Access

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Smart Parking Systems have emerged as a transformative solution to address the growing challenges associated with urbanization and increasing vehicular traffic. Such system integrates sensors, cameras, and other IoT connected devices to monitor parking spaces in real time. However, there are many security vulnerabilities in existing solutions, especially when it comes to car authentication at parking entry points. IoT sensors my be susceptible to Cyber-attacks and fraudulent activities, such as car theft, can exploit these vulnerabilities due to limited built-in security features. The reliability of authentication systems, based on IoT sensors can also be compromised by factors such as extreme weather conditions and physical damage. The cyber-physical solution we propose relies on Physical Unclonable Functions (PUFs) for identification and authentication in IoT devices to mitigate these challenges. The use of PUFs enhances the reliability and security of smart parking systems against unauthorized access and fraud. Furthermore, to ensure the integrity and confidentiality of the data within the smart parking ecosystem and to improve authentication process, we propose the implementation of a tailored blockchain framework. This framework incorporates lightweight local blockchains dedicated to individual parking slots, complemented by a central blockchain that manages data at the city level. The experimental results demonstrate the feasibility of the PUF computation process, showcasing an acceptable runtime for practical implementation. In the experimental results, we evaluated the SRAM used for the PUF implementation process and demonstrated its stability (intra HD equals to 2.25

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Section: ) Sram Processingmentioning

confidence: 99%

Section: ) Sram Processingmentioning

confidence: 99%

PufParkChain: Secure and Smart Parking Based on PUF Authentication and Lightweight Blockchain

Turki,

Dammak,

Alshahrani

2024

IEEE Access

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“…Given how one of the selling points of PUFs is their low cost of implementation, there is a push to reduce the ECC cost to a minimum. Some strategies employed are to make ECCs as efficient as possible [8][10] [11] or to develop selection methods to use only those bits in an SRAM array that most reliably power up to the same values [12]- [14]. In either case, it is important to accurately know the reliability of the resulting implementation to use the precise amount of ECC required, without over-or under-compensating, or to know how reliable the selection of cells really is.…”

Section: Introductionmentioning

confidence: 99%

“…On the contrary, the power-up behavior of the SRAM cells is heterogeneous, each cell has a certain reliability and sensitivity to changes in operating conditions [15]. Understandably, most works follow the homogeneous approach [5][7][9]- [14] [16], as developing an accurate model for the power-up behavior of SRAM cells is a complex undertaking. There are works that do propose one, but they come with limitations.…”

Section: Introductionmentioning

confidence: 99%

A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array

Santana-Andreo,

Saraza-Canflanca,

Carrasco-Lopez

et al. 2023

2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (

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The use of SRAM power-up values is the foundation of one of the most common Physical Unclonable Functions (PUFs) implementations, providing a Root-of-Trust for cryptographic applications at a low cost. PUFs are required to return the same response each time it is requested. However, SRAM power-ups by themselves are not reliable enough for the demanding PUF applications. This problem is solved by a variety of techniques that rely on an expected baseline reliability, extracted from tests performed under process, voltage and temperature variations. Nevertheless, aging effects, specifically Bias Temperature Instability (BTI), can have a significant impact that may not conform to the said baseline and are often ignored or overlooked due to the difficulty in properly characterizing and modeling them. In this work, we employ our custom chip specifically made to facilitate the characterization of aging through stress, i.e., applying a supply voltage larger than the nominal voltage to accelerate the impact of BTI and thus provide a more detailed look into the behavior of aging in an SRAM PUF array.

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“…The effects of process variation and aging on the power-up states of SRAM arrays have been extensively studied. Over the years, researchers have proposed physically unclonable functions (PUFs) [19]- [21] and true random number generators (TRNGs) [20], [22], [23] using SRAMs for creating unclonable device identifiers (IDs), and generating on-chip encryption keys. Due to the process variation, it becomes feasible to extract unique device fingerprints and create random numbers from an SRAM array.…”

Section: Introductionmentioning

confidence: 99%

Beware of Discarding Used SRAMs: Information is Stored Permanently

Hovanes¹,

Zhong²,

Guin³

2022

Preprint

Self Cite

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Data recovery has long been a focus of the electronics industry for decades by security experts, focusing on hard disk recovery, a type of non-volatile memory. Unfortunately, none of the existing research, neither from academia, industry, or government, have ever considered data recovery from volatile memories. The data is lost when it is powered off, by definition. To the best of our knowledge, we are the first to present an approach to recovering data from a static random access memory. It is conventional wisdom that SRAM loses its contents whenever it turns off, and it is not required to protect sensitive information, e.g., the firmware code, secret encryption keys, etc., when an SRAM-based computing system retires. Unfortunately, the recycling of integrated circuits poses a severe threat to the protection of intellectual properties. In this paper, we present a novel concept to retrieve SRAM data as the aging of SRAMs leads to a power-up state with an imprint of the stored values. We show that our proposed approaches can partially recover the previously used SRAM content. The accuracy of the recovered data can be further increased by incorporating multiple SRAM chips compared to a single one. It is impossible to retrieve the prior content of some stable SRAM cells, where aging shifts these cells towards stability. As the locations of these cells vary from chip to chip due to uncontrollable process variation, the same cell has a higher chance of being unstable or stable against aging in any of the chips, which helps us recover the content. Finally, majority voting is used to combine a set of SRAM chips' data to recover the stored data. We present our experimental result using commercial off-the-shelf SRAM chips with stored binary image data before performing accelerated aging. We demonstrate the successful partial retrieval on SRAM chips that are aged with as little as 4 hours of accelerated aging with 85 • C.

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A Systematic Bit Selection Method for Robust SRAM PUFs

Cited by 8 publications

References 28 publications

PufParkChain: Secure and Smart Parking Based on PUF Authentication and Lightweight Blockchain

PufParkChain: Secure and Smart Parking Based on PUF Authentication and Lightweight Blockchain

A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array

Beware of Discarding Used SRAMs: Information is Stored Permanently

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