2004
DOI: 10.1016/j.jelechem.2003.11.059
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A systematic approach toward error structure identification for impedance spectroscopy

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Cited by 70 publications
(74 citation statements)
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References 41 publications
(53 reference statements)
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“…The regression was weighted by the inverse of the variance of the stochastic part of the measurement. In all conditions the weighted sum of the square of the residuals was below one [30].…”
Section: 6mentioning
confidence: 88%
See 1 more Smart Citation
“…The regression was weighted by the inverse of the variance of the stochastic part of the measurement. In all conditions the weighted sum of the square of the residuals was below one [30].…”
Section: 6mentioning
confidence: 88%
“…A rigorous fitting procedure was performed. Six replicate measurements for each storage time were carried out, and the error structure was assessed following the method recommended by Agarwal et al [27][28][29] and Orazem [30]. The standard deviation for the real (σ Zr ) and imaginary (σ Z j ) parts of the impedance followed the form proposed by Orazem (see eq.…”
Section: 6mentioning
confidence: 99%
“…The error structure model employed, in which the standard deviation of the impedance is given as σ = 0.002 |Z|, is in agreement with the error structures obtained under potentiometric modulation. [22,27] The results presented in Figure 1(a) suggest that addition of the random noise does not have visible effects on the impedance data. Figure 1(b) suggests that the ohmic-resistancecorrected phase angle is more sensitive to the added noise, but the effects are small.…”
Section: Synthetic Constant-phase-element Datamentioning
confidence: 92%
“…(3) was based on the CNLS (Complex Nonlinear Squares) method. A rigorous fitting procedure was performed where the error structure was assessed following the references [25][26][27][28]. Continuous lines in Fig.…”
Section: Ac Impedance Measurements and Interpretation Ofmentioning
confidence: 99%