A System-Level Electrostatic-Discharge-Protection Modeling Methodology for Time-Domain Analysis

Monnereau, Nicolas; Caignet, Fabrice; Trémouilles, David; Nolhier, Nicolas; Bafleur, Marise

doi:10.1109/temc.2012.2208973

Cited by 11 publications

(2 citation statements)

References 14 publications

(12 reference statements)

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“…Dedicated ESD protection models need to be added to SI models to consider high power transient events. Such models have now been studied for around ten years and behavioral descriptions were first proposed in [10] [12]. The models are extracted from Transmission Line Pulse (TLP) quasi-static measurements [13][14] [15].…”

Section: Introductionmentioning

confidence: 99%

Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model From TLP Measurement

Escudié

Caignet

Nolhier

et al. 2022

IEEE Trans. Electromagn. Compat.

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In order to ensure reliability of systems early in the design phase, it is becoming crucial to have models able to predict the behavior of systems exposed to ElectroStatic Discharge (ESD). This is an increasing necessity since the number of embedded electronic products is growing and since they are employed in applications where people's safety is a requirement, such as automotive and aeronautic applications. Until now, quasi-static models of protection devices have succeeded in providing fairly good results in failure predictions (mainly hard failures). Today, the increased frequency range of such devices requires dynamic models able to reproduce their transient behavior. In this paper, we investigate if conventional methods for modeling linear devices, generally used in the frequency domain, could be used to obtain an equivalent frequency model for ESD protection devices, which exhibit non-linear behavior. A methodology to extract an ESD protection SPICE model from Transmission Line Pulse (TLP) measurements to address transient and frequency simulation is proposed and detailed. We demonstrate that, in well-defined conditions, such frequency models can give accurate results to predict overshoots related to protection device triggering delays. Validation of the models is performed under TLP and Human Metal Model (HMM) conditions on three off-the-shelf devices.

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Section: Introductionmentioning

confidence: 99%

Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model From TLP Measurement

Escudié

Caignet

Nolhier

et al. 2022

IEEE Trans. Electromagn. Compat.

Self Cite

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“…The key measurement system to build models of ESD protections is the transmission line pulse (TLP) generator [3], [4]. Many studies have proposed quasi-static models based on TLP measurements [5], [6]. A piecewise linear I(V) curve is extracted and used in the simulation.…”

Section: Introductionmentioning

confidence: 99%

Investigation of Frequency Models to Predict Dynamic Behavior of ESD Protection Networks

Caignet

Ruffat

Boyer

et al. 2022

IEEE Trans. Electromagn. Compat.

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With the shrinking dimension of technologies and safety requirements, electrostatic discharge (ESD) protections play a more and more important role. Consequently, the prediction of the transient behavior's protection network is becoming difficult for system level designers in order to guarantee systems safety. A model reproducing the turn-ON behavior is needed to obtain a precise simulation's protection strategy network, especially during the protection triggering. In this article, we propose a complete measurement and computation setup to access an equivalent frequency model of devices under strong pulse injections for a rapid model construction. Details of the measurement and data computation to obtain a frequency model using a transmission line pulse generator combined with time-domain reflectometry measurement will be provided. To validate our proposed frequency model, a comparison between the measurements and simulations is first performed on passive and linear components, and then on two protection devices (transient voltage suppressor). A simulation on a protection network, at the board level, will show that the combination of the frequency models could be done to predict its response to ESD pulse with an acceptable precision, without the tedious step of component modeling.

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21.1: Invited Paper: System‐Level Co‐simulation Combined with Full‐wave 3D Model and Circuit Elements for Electrostatic Discharge in Display Devices

Yang

Wang

et al. 2021

Symp Digest of Tech Papers

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Co‐simulation combined with Full‐wave 3D and circuit elements is used to investigate ESD effects on signal transferring of a simplified smart phone device. A square wave with amplitude of 1.8V is applied to an address line transferring from CPU to DDR cache. Both the signal frequency and the position at the address line are simulated on signal transferring. The simulation results indicate that ESD event actually influences the signal transferring which may lead to error data transferring.

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A System-Level Electrostatic-Discharge-Protection Modeling Methodology for Time-Domain Analysis

Cited by 11 publications

References 14 publications

Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model From TLP Measurement

Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model From TLP Measurement

Investigation of Frequency Models to Predict Dynamic Behavior of ESD Protection Networks

21.1: Invited Paper: System‐Level Co‐simulation Combined with Full‐wave 3D Model and Circuit Elements for Electrostatic Discharge in Display Devices

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