Proceedings Third IEEE Workshop on Applications of Computer Vision. WACV'96
DOI: 10.1109/acv.1996.572064
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A system for detection of internal log defects by computer analysis of axial CT images

Abstract: This paper presents a system for detection of some important internal log defects via analysis of axial CT images. Two major procedures are used: the first is the segmentation of a single computer tomography (CT) image slice which extracts defect-like regions from the image slice, the second is correlation analysis of the defect-like regions across CT image slices. The segmentation algorithm for a single CT image is basically a complex form of multiple thresholding that exploits both the prior knowledge of woo… Show more

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Cited by 13 publications
(4 citation statements)
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“…In our opinion, Bhandarkar et al (1996;1999) gave the most finalised algorithm that we found in the literature. The first step consisted in the segmentation of CT images in four pixel classes (the knots belonged to the class with the highest density) by using a complex form of an area-based multiple thresholding algorithm.…”
Section: Review Of Existing Methods To Non-destructively and Automatimentioning
confidence: 85%
“…In our opinion, Bhandarkar et al (1996;1999) gave the most finalised algorithm that we found in the literature. The first step consisted in the segmentation of CT images in four pixel classes (the knots belonged to the class with the highest density) by using a complex form of an area-based multiple thresholding algorithm.…”
Section: Review Of Existing Methods To Non-destructively and Automatimentioning
confidence: 85%
“…In the literature, several methods have been proposed for pith detection on log cross-sections. Most of them [2,3,9,14,15,24] have been developed for X-ray computed tomographic (CT) images. The techniques based on CT images allow an efficient and robust detection of external and internal characteristics of tree logs, including the pith.…”
Section: Introductionmentioning
confidence: 99%
“…Zhu et al [7] described a segmentation approach that relied heavily on edge and texture measures. Bhandarkar et al [8] described an correlationbased approach to defect detection. Schmoldt et al [9][10][11] described an approach that used artificial neural nets (ANN) to classify pixels individually, using small neighborhoods of CT density values as input feature vectors.…”
Section: Introductionmentioning
confidence: 99%